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{"_buckets": {"deposit": "b28f39df-9d46-4259-a811-473b455db3ed"}, "_deposit": {"id": "2214", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "2214"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00002214", "sets": ["454", "425"]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1999-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "10", "bibliographicPageEnd": "1682", "bibliographicPageStart": "1679", "bibliographicVolumeNumber": "38", "bibliographic_titles": [{"bibliographic_title": "Optical Engineering"}, {"bibliographic_title": "Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A superluminescent diode interferometer that uses sinusoidal phase-modulating interferometry and the shifting method is applied to measure the front and rear surface profiles of a glass plate with an accuracy of a few nanometers. Since the roughness of the reference surface is large, a glass plate is put behind the object as another reference surface, which is estimated by the shifting method with an accuracy of a few nanometers.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_5_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/1.602038", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_5_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00333891", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00913286", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "7498", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Nakada, Takayuki"}], "nameIdentifiers": [{"nameIdentifier": "7499", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-29"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "38_10_1679-1682.pdf", "filesize": [{"value": "425.9 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 425900.0, "url": {"label": "38_10_1679-1682.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/2214/files/38_10_1679-1682.pdf"}, "version_id": "ba61a9d7-713b-4e08-8cb1-4adcaee9b3ca"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "low coherence interferometry", "subitem_subject_scheme": "Other"}, {"subitem_subject": "superluminescent diode", "subitem_subject_scheme": "Other"}, {"subitem_subject": "surface profiles", "subitem_subject_scheme": "Other"}, {"subitem_subject": "glass plate", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer"}, {"subitem_title": "Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["454", "425"], "permalink_uri": "http://hdl.handle.net/10191/27592", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "2214", "relation": {}, "relation_version_is_last": true, "title": ["Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer"], "weko_shared_id": null}
Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer
http://hdl.handle.net/10191/27592
http://hdl.handle.net/10191/2759204fc70a7-7b05-4e47-b2fe-22d570de5673
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2014-06-20 | |||||
タイトル | ||||||
タイトル | Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | low coherence interferometry | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | superluminescent diode | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | surface profiles | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | glass plate | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
著者 |
Sasaki, Osami
× Sasaki, Osami× Nakada, Takayuki× Suzuki, Takamasa |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A superluminescent diode interferometer that uses sinusoidal phase-modulating interferometry and the shifting method is applied to measure the front and rear surface profiles of a glass plate with an accuracy of a few nanometers. Since the roughness of the reference surface is large, a glass plate is put behind the object as another reference surface, which is estimated by the shifting method with an accuracy of a few nanometers. | |||||
書誌情報 |
Optical Engineering en : Optical Engineering 巻 38, 号 10, p. 1679-1682, 発行日 1999-10 |
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出版者 | ||||||
出版者 | International Society for Optical Engineering, SPIE | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00913286 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00333891 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1117/1.602038 | |||||
権利 | ||||||
権利情報 | Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. | |||||
著者版フラグ | ||||||
値 | publisher |