{"created":"2021-03-01T06:05:54.731387+00:00","id":2214,"links":{},"metadata":{"_buckets":{"deposit":"b28f39df-9d46-4259-a811-473b455db3ed"},"_deposit":{"id":"2214","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2214"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002214","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageEnd":"1682","bibliographicPageStart":"1679","bibliographicVolumeNumber":"38","bibliographic_titles":[{"bibliographic_title":"Optical Engineering"},{"bibliographic_title":"Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A superluminescent diode interferometer that uses sinusoidal phase-modulating interferometry and the shifting method is applied to measure the front and rear surface profiles of a glass plate with an accuracy of a few nanometers. Since the roughness of the reference surface is large, a glass plate is put behind the object as another reference surface, which is estimated by the shifting method with an accuracy of a few nanometers.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/1.602038","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00333891","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00913286","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"7498","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakada, Takayuki"}],"nameIdentifiers":[{"nameIdentifier":"7499","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"38_10_1679-1682.pdf","filesize":[{"value":"425.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"38_10_1679-1682.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2214/files/38_10_1679-1682.pdf"},"version_id":"ba61a9d7-713b-4e08-8cb1-4adcaee9b3ca"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"low coherence interferometry","subitem_subject_scheme":"Other"},{"subitem_subject":"superluminescent diode","subitem_subject_scheme":"Other"},{"subitem_subject":"surface profiles","subitem_subject_scheme":"Other"},{"subitem_subject":"glass plate","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer"},{"subitem_title":"Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"2214","relation_version_is_last":true,"title":["Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:35:02.791150+00:00"}