{"_buckets": {"deposit": "96acb8c9-e121-49d1-b01c-eca4540bd8d7"}, "_deposit": {"id": "2203", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "2203"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00002203"}, "item_5_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2005-04", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "4", "bibliographicPageEnd": "043601-6", "bibliographicPageStart": "043601-1", "bibliographicVolumeNumber": "44", "bibliographic_titles": [{"bibliographic_title": "Optical Engineering"}, {"bibliographic_title": "Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "A two-grating interferometer for measurement of profiles of polished surfaces is proposed. The +/-first-order beams diffracted by the first grating produce parallel fringes of about 50-\u00b5m spacing on an object surface. By using the second grating, we eliminate the parallel fringes and extract a phase distribution produced by the surface profile of the object. Moreover, the vibration of the second grating of a small size enables us to use the sinusoidal phase-modulating interferometry. Measurement resolution is higher than 0.3 \u00b5m at the equivalent wavelength of 35 \u00b5m.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_7": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_5_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/1.1883083", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_15": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright 2005 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_5_select_19": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00333891", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00913286", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Xu, Yande"}], "nameIdentifiers": [{"nameIdentifier": "7453", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "7454", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-29"}], "displaytype": "detail", "download_preview_message": "", "filename": "44_4_043601.pdf", "filesize": [{"value": "575.5 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 5755000, "url": {"label": "44_4_043601.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/2203/files/44_4_043601.pdf"}, "version_id": "5a927b26-b326-4d60-9224-d426a5a05640"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "surface profile measurement", "subitem_subject_scheme": "Other"}, {"subitem_subject": "grating interferometer", "subitem_subject_scheme": "Other"}, {"subitem_subject": "fringe projection", "subitem_subject_scheme": "Other"}, {"subitem_subject": "sinusoidal phase modulation", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Two-grating interferometer with sinusoidal phase modulation for surface profile measurement", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Two-grating interferometer with sinusoidal phase modulation for surface profile measurement"}, {"subitem_title": "Two-grating interferometer with sinusoidal phase modulation for surface profile measurement", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["453/454", "423/424/425"], "permalink_uri": "http://hdl.handle.net/10191/27620", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "2203", "relation": {}, "relation_version_is_last": true, "title": ["Two-grating interferometer with sinusoidal phase modulation for surface profile measurement"], "weko_shared_id": null}