{"created":"2021-03-01T06:05:54.043287+00:00","id":2203,"links":{},"metadata":{"_buckets":{"deposit":"96acb8c9-e121-49d1-b01c-eca4540bd8d7"},"_deposit":{"id":"2203","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2203"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002203","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"043601-6","bibliographicPageStart":"043601-1","bibliographicVolumeNumber":"44","bibliographic_titles":[{"bibliographic_title":"Optical Engineering"},{"bibliographic_title":"Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A two-grating interferometer for measurement of profiles of polished surfaces is proposed. The +/-first-order beams diffracted by the first grating produce parallel fringes of about 50-µm spacing on an object surface. By using the second grating, we eliminate the parallel fringes and extract a phase distribution produced by the surface profile of the object. Moreover, the vibration of the second grating of a small size enables us to use the sinusoidal phase-modulating interferometry. Measurement resolution is higher than 0.3 µm at the equivalent wavelength of 35 µm.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/1.1883083","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 2005 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00333891","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00913286","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Xu, Yande"}],"nameIdentifiers":[{"nameIdentifier":"7453","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"7454","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"44_4_043601.pdf","filesize":[{"value":"575.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"44_4_043601.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2203/files/44_4_043601.pdf"},"version_id":"5a927b26-b326-4d60-9224-d426a5a05640"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"surface profile measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"grating interferometer","subitem_subject_scheme":"Other"},{"subitem_subject":"fringe projection","subitem_subject_scheme":"Other"},{"subitem_subject":"sinusoidal phase modulation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Two-grating interferometer with sinusoidal phase modulation for surface profile measurement","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Two-grating interferometer with sinusoidal phase modulation for surface profile measurement"},{"subitem_title":"Two-grating interferometer with sinusoidal phase modulation for surface profile measurement","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"2203","relation_version_is_last":true,"title":["Two-grating interferometer with sinusoidal phase modulation for surface profile measurement"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:35:01.161720+00:00"}