WEKO3
アイテム
{"_buckets": {"deposit": "7e89a9cf-7d29-4db6-97d7-bd7b4ccfaead"}, "_deposit": {"id": "31066", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31066"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031066", "sets": ["457", "1827"]}, "item_8_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1999-06", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "139", "bibliographicPageStart": "136", "bibliographicVolumeNumber": "3740", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A system of rotation angle measurement based on the fringe projection is proposed and demonstrated. This system has potential for a broad range of uses and a robustness for the external disturbances, because it requires no coherent light. The setup is very simple and applicable to the automatic on- line measurement. Several measurements indicate a sensitivity of 5 arcsec.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "Optical engineering for sensing and nanotechnology : International conference on optical sensing and nanotechnology : Jun 1999, Yokohama, Japan", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.347784", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_8_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Nakamura, Hideki"}], "nameIdentifiers": [{"nameIdentifier": "169518", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Greivenkamp, John E."}], "nameIdentifiers": [{"nameIdentifier": "169519", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "169520", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "3740_136-139.pdf", "filesize": [{"value": "326.9 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 326900.0, "url": {"label": "3740_136-139.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31066/files/3740_136-139.pdf"}, "version_id": "63fc86ee-c0ce-4280-8fa6-d41d29c26845"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "rotation angle measurement", "subitem_subject_scheme": "Other"}, {"subitem_subject": "image processing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "fringe projection", "subitem_subject_scheme": "Other"}, {"subitem_subject": "on-line measurement", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Rotation angle measurement using an imaging method", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Rotation angle measurement using an imaging method"}, {"subitem_title": "Rotation angle measurement using an imaging method", "subitem_title_language": "en"}]}, "item_type_id": "8", "owner": "1", "path": ["457", "1827"], "permalink_uri": "http://hdl.handle.net/10191/27498", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "31066", "relation": {}, "relation_version_is_last": true, "title": ["Rotation angle measurement using an imaging method"], "weko_shared_id": null}
Rotation angle measurement using an imaging method
http://hdl.handle.net/10191/27498
http://hdl.handle.net/10191/274982defd7e9-51b0-4798-9871-6a77316154bd
名前 / ファイル | ライセンス | アクション |
---|---|---|
3740_136-139.pdf (326.9 kB)
|
|
Item type | 会議発表論文 / Conference Paper(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2014-06-20 | |||||
タイトル | ||||||
タイトル | Rotation angle measurement using an imaging method | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Rotation angle measurement using an imaging method | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | rotation angle measurement | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | image processing | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | fringe projection | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | on-line measurement | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_5794 | |||||
タイプ | conference paper | |||||
著者 |
Suzuki, Takamasa
× Suzuki, Takamasa× Nakamura, Hideki× Greivenkamp, John E.× Sasaki, Osami |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A system of rotation angle measurement based on the fringe projection is proposed and demonstrated. This system has potential for a broad range of uses and a robustness for the external disturbances, because it requires no coherent light. The setup is very simple and applicable to the automatic on- line measurement. Several measurements indicate a sensitivity of 5 arcsec. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Optical engineering for sensing and nanotechnology : International conference on optical sensing and nanotechnology : Jun 1999, Yokohama, Japan | |||||
書誌情報 |
Proceedings of SPIE - the International Society for Optical Engineering en : Proceedings of SPIE - the International Society for Optical Engineering 巻 3740, p. 136-139, 発行日 1999-06 |
|||||
出版者 | ||||||
出版者 | International Society for Optical Engineering, SPIE | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0277786X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA10619755 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1117/12.347784 | |||||
権利 | ||||||
権利情報 | Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. | |||||
著者版フラグ | ||||||
値 | publisher |