{"created":"2021-03-01T06:37:12.003259+00:00","id":31066,"links":{},"metadata":{"_buckets":{"deposit":"7e89a9cf-7d29-4db6-97d7-bd7b4ccfaead"},"_deposit":{"id":"31066","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31066"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031066","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999-06","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"139","bibliographicPageStart":"136","bibliographicVolumeNumber":"3740","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A system of rotation angle measurement based on the fringe projection is proposed and demonstrated. This system has potential for a broad range of uses and a robustness for the external disturbances, because it requires no coherent light. The setup is very simple and applicable to the automatic on- line measurement. Several measurements indicate a sensitivity of 5 arcsec.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Optical engineering for sensing and nanotechnology : International conference on optical sensing and nanotechnology : Jun 1999, Yokohama, Japan","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.347784","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakamura, Hideki"}],"nameIdentifiers":[{"nameIdentifier":"169518","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Greivenkamp, John E."}],"nameIdentifiers":[{"nameIdentifier":"169519","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169520","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"3740_136-139.pdf","filesize":[{"value":"326.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"3740_136-139.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31066/files/3740_136-139.pdf"},"version_id":"63fc86ee-c0ce-4280-8fa6-d41d29c26845"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"rotation angle measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"image processing","subitem_subject_scheme":"Other"},{"subitem_subject":"fringe projection","subitem_subject_scheme":"Other"},{"subitem_subject":"on-line measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Rotation angle measurement using an imaging method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Rotation angle measurement using an imaging method"},{"subitem_title":"Rotation angle measurement using an imaging method","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"31066","relation_version_is_last":true,"title":["Rotation angle measurement using an imaging method"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:01:36.233640+00:00"}