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  1. 050 理学部
  2. 20 紀要
  3. 02 Science reports of Niigata University. (Geology)
  4. No.19
  1. 0 資料タイプ別
  2. 03 紀要論文

Quantitative analysis of rock-forming minerals using the energy-dispersive X-ray spectrometer

http://hdl.handle.net/10191/2138
http://hdl.handle.net/10191/2138
585522b4-3b79-474c-b698-51612a5fe067
名前 / ファイル ライセンス アクション
19_1-13.pdf 19_1-13.pdf (2.2 MB)
Item type 紀要論文 / Departmental Bulletin Paper(1)
公開日 2017-08-24
タイトル
タイトル Quantitative analysis of rock-forming minerals using the energy-dispersive X-ray spectrometer
タイトル
言語 en
タイトル Quantitative analysis of rock-forming minerals using the energy-dispersive X-ray spectrometer
言語
言語 eng
キーワード
主題Scheme Other
主題 EDS
キーワード
主題Scheme Other
主題 energy-dispersive X-ray spectrometer
キーワード
主題Scheme Other
主題 EPMA
キーワード
主題Scheme Other
主題 Oxford Link ISIS
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ departmental bulletin paper
著者 Kawabata, Hiroshi

× Kawabata, Hiroshi

WEKO 54460

Kawabata, Hiroshi

Search repository
Shimura, Toshiaki

× Shimura, Toshiaki

WEKO 54461

Shimura, Toshiaki

Search repository
Sato, Makoto

× Sato, Makoto

WEKO 54462

Sato, Makoto

Search repository
抄録
内容記述タイプ Abstract
内容記述 This paper describes the sources of error and the methods for quantitative analysis using an energy-dispersive X-ray spectrometer. On the probe current correction method used in this system, the accuracy is significantly affected by the intensity of the cobalt Ka line. A 1% difference in cobalt intensity or probe current shifts the oxide concentration by about 1%. Therefore, calibration using the appropriate X-ray intensity of cobalt and a steady probe current are essential in obtaining satisfactory results. Another potential error source is distortion of the spectrum caused by characteristics of the semiconductor detector. Although the sum peak and escape peak can be avoided by careful identification of the peaks, silicon internal fluorescence X-ray is not distinguishable from the original Si Kα emanating from the sample, and causes an overestimation of about 0.15% Si. Since incomplete charge collection also overestimates concentration, especially for low energy elements, correction for incomplete charge collection is required to analyze low energy trace elements accurately. Analytical results of minerals and a glass indicate that oxides with concentrations >0.7% can be analyzed with a less than 10% RSD (relative standard deviation), and are in agreement with the results using the wavelengthdispersive X-ray spectrometer.
書誌情報 Science reports of Niigata University. (Geology)
en : Science reports of Niigata University. (Geology)

巻 19, p. 1-13, 発行日 2004-03
出版者
出版者 新潟大学理学部
ISSN
収録物識別子タイプ ISSN
収録物識別子 13491237
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA11436808
著者版フラグ
値 publisher
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