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高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究
http://hdl.handle.net/10191/6999
3100d825-5ceb-49a5-b796-096df574c423
名前 / ファイル | ライセンス | アクション | |
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Item type | 研究報告書 / Research Paper(1) | |||||
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公開日 | 2009-04-05 | |||||
タイトル | ||||||
タイトル | 高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | 高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_18ws | |||||
タイプ | research report | |||||
著者 |
土屋, 良海
× 土屋, 良海 |
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内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 平成16年度~平成18年度日本学術振興会科学研究費補助金(基盤研究(C))研究成果報告書(課題番号:16560577) | |||||
書誌情報 | 発行日 2007 | |||||
著者版フラグ | ||||||
値 | author |