{"created":"2021-03-01T06:39:46.767661+00:00","id":33360,"links":{},"metadata":{"_buckets":{"deposit":"7d50bfc2-c2ce-417f-9956-dcd045cd7749"},"_deposit":{"id":"33360","owners":[],"pid":{"revision_id":0,"type":"depid","value":"33360"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00033360","sets":["176:1894:1895","453:461"]},"item_12_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{}]}]},"item_12_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"平成16年度～平成18年度日本学術振興会科学研究費補助金(基盤研究(C))研究成果報告書(課題番号:16560577)","subitem_description_type":"Other"}]},"item_12_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"author"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"土屋, 良海"}],"nameIdentifiers":[{"nameIdentifier":"176052","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-09-11"}],"displaytype":"detail","filename":"2009030145.pdf","filesize":[{"value":"218.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"2009030145.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/33360/files/2009030145.pdf"},"version_id":"87b8de3a-9e70-4a21-8ee9-dd18480b9d86"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究"},{"subitem_title":"高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究","subitem_title_language":"en"}]},"item_type_id":"12","owner":"1","path":["461","1895"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-05"},"publish_date":"2009-04-05","publish_status":"0","recid":"33360","relation_version_is_last":true,"title":["高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:09:10.095854+00:00"}