{"_buckets": {"deposit": "476774fa-a4cd-4fa5-aae0-18185c06f814"}, "_deposit": {"id": "31073", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31073"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031073", "sets": ["457", "1827"]}, "item_8_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1992-01", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "83", "bibliographicPageStart": "77", "bibliographicVolumeNumber": "1553", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "We propose a phase locked interferometer where tunability of the wavelength of a laser diode is utilized. A CCD image sensor detects an interference signal electrically scanning a measuring point along a surface of an object. The phase of the interference signal changes according to the surface profile. This phase is kept at a constant value by controlling the injection current of the laser diode with a feedback control system. The surface profile is obtained from the change in the injection current. The feedback signal is generated directly from the output of the CCD image sensor, which enables us to make high-speed measurements in real time. The scanning time required to complete the measurement for one measuring point was from approximately 2 msec to approximately 10 msec. External disturbances such as mechanical vibrations cause phase variations in the interference signal, and accurate measurements become impossible. Detection of the phase variation at a fixed point on the surface of the object is added to the phase locked interferometer. The feedback control of the injection current is done alternately for the fixed point and the measuring point. An exact surface profile is obtained by subtracting the phase variation detected at the fixed point from the surface profile detected at the measuring points. We could improve the measurement accuracy from approximately 20 nm to approximately 5 nm in surface profile measurements of diamond turned aluminum disks.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "Laser interferometry 4 : computer-aided interferometry : 4th International conference : Jul 1991, San Diego, CA", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.135358", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright 1992 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_8_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "169545", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Higuchi, Katsuhiro"}], "nameIdentifiers": [{"nameIdentifier": "169547", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "1553_77-83.pdf", "filesize": [{"value": "475.6 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 475600.0, "url": {"label": "1553_77-83.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31073/files/1553_77-83.pdf"}, "version_id": "a5d428aa-681e-425b-b769-70bfdd8f69f2"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Phase-locked laser diode interferometer", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Phase-locked laser diode interferometer"}, {"subitem_title": "Phase-locked laser diode interferometer", "subitem_title_language": "en"}]}, "item_type_id": "8", "owner": "1", "path": ["457", "1827"], "permalink_uri": "http://hdl.handle.net/10191/27475", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "31073", "relation": {}, "relation_version_is_last": true, "title": ["Phase-locked laser diode interferometer"], "weko_shared_id": null}