ログイン
言語:

WEKO3

  • トップ
  • ランキング
To
lat lon distance
To

Field does not validate



インデックスリンク

インデックスツリー

メールアドレスを入力してください。

WEKO

One fine body…

WEKO

One fine body…

アイテム

{"_buckets": {"deposit": "0dcb0f28-ced3-4ffb-ac61-6c8c9d82b3b5"}, "_deposit": {"id": "31056", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31056"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031056", "sets": ["457", "1827"]}, "item_8_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2002-08", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "855", "bibliographicPageStart": "853", "bibliographicVolumeNumber": "4829", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Phase modulation amplitude Z_b caused by a sinusoidal wavelength-scanning and conventional phase α of an interference signal are kept at π and 3π/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scannig becomes a ruler marked out every a wavelength. Real-time distance measurement is carried out with this interferometer.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "19th congress of the international commission for optics : optics for the quality of life : 25-30 August 2002 : Firenze, Italy. : Aug 2002, Firenze, Italy", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.530947", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright 2002 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_8_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "169478", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Akiyama, Hisashi"}], "nameIdentifiers": [{"nameIdentifier": "169479", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "4829_853-855.pdf", "filesize": [{"value": "238.5 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 238500.0, "url": {"label": "4829_853-855.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31056/files/4829_853-855.pdf"}, "version_id": "259eb812-1aa2-4956-ab7f-f76f61a86c61"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control"}, {"subitem_title": "Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control", "subitem_title_language": "en"}]}, "item_type_id": "8", "owner": "1", "path": ["457", "1827"], "permalink_uri": "http://hdl.handle.net/10191/27492", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "31056", "relation": {}, "relation_version_is_last": true, "title": ["Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control"], "weko_shared_id": null}
  1. 060 工学部
  2. 40 学会発表資料
  3. 06 SPIE
  1. 0 資料タイプ別
  2. 04 会議発表論文

Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control

http://hdl.handle.net/10191/27492
http://hdl.handle.net/10191/27492
73490c7d-2436-4131-9062-144c3ecdaf89
名前 / ファイル ライセンス アクション
4829_853-855.pdf 4829_853-855.pdf (238.5 kB)
Item type 会議発表論文 / Conference Paper(1)
公開日 2014-06-20
タイトル
タイトル Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control
タイトル
言語 en
タイトル Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control
言語
言語 eng
資源タイプ
資源 http://purl.org/coar/resource_type/c_5794
タイプ conference paper
著者 Sasaki, Osami

× Sasaki, Osami

WEKO 169478

Sasaki, Osami

Search repository
Akiyama, Hisashi

× Akiyama, Hisashi

WEKO 169479

Akiyama, Hisashi

Search repository
Suzuki, Takamasa

× Suzuki, Takamasa

WEKO 39

Suzuki, Takamasa

Search repository
抄録
内容記述タイプ Abstract
内容記述 Phase modulation amplitude Z_b caused by a sinusoidal wavelength-scanning and conventional phase α of an interference signal are kept at π and 3π/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scannig becomes a ruler marked out every a wavelength. Real-time distance measurement is carried out with this interferometer.
内容記述
内容記述タイプ Other
内容記述 19th congress of the international commission for optics : optics for the quality of life : 25-30 August 2002 : Firenze, Italy. : Aug 2002, Firenze, Italy
書誌情報 Proceedings of SPIE - the International Society for Optical Engineering
en : Proceedings of SPIE - the International Society for Optical Engineering

巻 4829, p. 853-855, 発行日 2002-08
出版者
出版者 International Society for Optical Engineering, SPIE
ISSN
収録物識別子タイプ ISSN
収録物識別子 0277786X
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA10619755
DOI
識別子タイプ DOI
関連識別子 info:doi/10.1117/12.530947
権利
権利情報 Copyright 2002 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
著者版フラグ
値 publisher
戻る
0
views
See details
Views

Versions

Ver.1 2021-03-01 09:59:15.404938
Show All versions

Share

Mendeley Twitter Facebook Print Addthis

Cite as

エクスポート

OAI-PMH
  • OAI-PMH JPCOAR
  • OAI-PMH DublinCore
  • OAI-PMH DDI
Other Formats
  • JSON
  • BIBTEX

Confirm


Powered by WEKO3


Powered by WEKO3