@inproceedings{oai:niigata-u.repo.nii.ac.jp:00031056,
 author = {Sasaki, Osami and Akiyama, Hisashi and Suzuki, Takamasa},
 book = {Proceedings of SPIE - the International Society for Optical Engineering, Proceedings of SPIE - the International Society for Optical Engineering},
 month = {Aug},
 note = {Phase modulation amplitude Z_b caused by a sinusoidal wavelength-scanning and conventional phase α of an interference signal are kept at π and 3π/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scannig becomes a ruler marked out every a wavelength. Real-time distance measurement is carried out with this interferometer., 19th congress of the international commission for optics : optics for the quality of life : 25-30 August 2002 : Firenze, Italy. : Aug 2002, Firenze, Italy},
 pages = {853--855},
 publisher = {International Society for Optical Engineering, SPIE},
 title = {Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control},
 volume = {4829},
 year = {2002}
}