{"_buckets": {"deposit": "4204334a-c17a-43fa-803f-87b8e48e0e3d"}, "_deposit": {"id": "31037", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31037"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031037", "sets": ["457", "1827"]}, "item_8_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2007-11", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "68290C-7", "bibliographicPageStart": "68290C-1", "bibliographicVolumeNumber": "6829", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A multi-period fringe-projection interferometry with back-propagation method is described to measure surface profiles of a glass plate. Phase distribution of the multi-period fringe formed by interfering the two calumniated laser beams is utilized to determine the position of the two surfaces of the glass plate. The multiple optical fields of the different fringe periods on the two surfaces, which are obtained from the sinusoidal phase-modulated interference signals, are back-propagated to a position where all of the phases of the multiple optical fields become zero. At the same time, the amplitude of the sum of the multiple back-propagated fields becomes maximum. The distances of the back-propagation provide the positions of the two surfaces of the glass plate. In the experiment a glass plates of 2mm-thickness is measured with a precision of 2.3μm.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "Advanced materials and devices for sensing and imaging 3 : 12-14 November 2007 : Beijing, China. : Nov 2007, Beijing, China", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.768064", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright 2007 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_8_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Huan, Hai"}], "nameIdentifiers": [{"nameIdentifier": "169411", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "169412", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "6829_68290C.pdf", "filesize": [{"value": "473.4 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 473400.0, "url": {"label": "6829_68290C.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31037/files/6829_68290C.pdf"}, "version_id": "7be58c58-d433-49ec-8186-ccc01c67fad3"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "back-propagation method", "subitem_subject_scheme": "Other"}, {"subitem_subject": "multi-period fringe projection", "subitem_subject_scheme": "Other"}, {"subitem_subject": "shape of glass plate", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Multiple-period fringe projection interferometry using a back-propagation method for surface measurement of glass plate", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Multiple-period fringe projection interferometry using a back-propagation method for surface measurement of glass plate"}, {"subitem_title": "Multiple-period fringe projection interferometry using a back-propagation method for surface measurement of glass plate", "subitem_title_language": "en"}]}, "item_type_id": "8", "owner": "1", "path": ["457", "1827"], "permalink_uri": "http://hdl.handle.net/10191/27497", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "31037", "relation": {}, "relation_version_is_last": true, "title": ["Multiple-period fringe projection interferometry using a back-propagation method for surface measurement of glass plate"], "weko_shared_id": null}