{"_buckets": {"deposit": "c2a97737-ff03-4506-886a-0c7d2b86287d"}, "_deposit": {"id": "31027", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31027"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031027"}, "item_8_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2011-11", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "82010B-12", "bibliographicPageStart": "82010B-1", "bibliographicVolumeNumber": "8201", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "We propose and demonstrate a novel processing cycle for sheet-metal working based on the computerized image processing techniques. The interconnected test system based on the cross network communication enables the effective fabrication cycle that realizes automatic inspection, quick delivery, and cost reduction.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "\u5185\u5bb9\u8a18\u8ff0", "attribute_value_mlt": [{"subitem_description": "Optoelectronic measurement technology and systems : 6-9 November 2011 : Beijing, China", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.906564", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright(C)2011 Society of Photo-Optical Instrumentation Engineers"}]}, "item_8_select_19": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sato, Kotaro"}], "nameIdentifiers": [{"nameIdentifier": "169375", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Muramatsu, Shogo"}], "nameIdentifiers": [{"nameIdentifier": "169376", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Murata, Mitsuyoshi"}], "nameIdentifiers": [{"nameIdentifier": "169377", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Oitate, Toshiro"}], "nameIdentifiers": [{"nameIdentifier": "169378", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "8201_82010B.pdf", "filesize": [{"value": "1.6 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1600000.0, "url": {"label": "8201_82010B.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31027/files/8201_82010B.pdf"}, "version_id": "1626225b-d993-4c0e-85bc-18896ea9b5a5"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Sheet-metal processing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "cross network", "subitem_subject_scheme": "Other"}, {"subitem_subject": "optical verification", "subitem_subject_scheme": "Other"}, {"subitem_subject": "image processing", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Online optical verification system for sheet-metal processing", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Online optical verification system for sheet-metal processing"}]}, "item_type_id": "8", "owner": "1", "path": ["453/457", "423/435/1827"], "permalink_uri": "http://hdl.handle.net/10191/31151", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2014-12-18"}, "publish_date": "2014-12-18", "publish_status": "0", "recid": "31027", "relation": {}, "relation_version_is_last": true, "title": ["Online optical verification system for sheet-metal processing"], "weko_shared_id": 2}