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正弦波状波長走査レーザ干渉法による形状計測に関する研究
http://hdl.handle.net/10191/1450
15a4f710-05ea-4ebb-8c15-16a4d38474af
名前 / ファイル | ライセンス | アクション | |
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||
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公開日 | 2007-04-23 | |||||
タイトル | ||||||
タイトル | 正弦波状波長走査レーザ干渉法による形状計測に関する研究 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | 正弦波状波長走査レーザ干渉法による形状計測に関する研究 | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Interferometer | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | wavelength-scanning | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Surface profile measurement | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | 干渉計 | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | 波長走査 | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | 表面形状計測 | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_46ec | |||||
タイプ | thesis | |||||
その他のタイトル | ||||||
その他のタイトル | Study on surface profile measurement by a sinusoidal wavelength-scanning interferometry | |||||
著者 |
秋山, 久
× 秋山, 久 |
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著者別名 | ||||||
識別子 | ||||||
識別子 | 48984 | |||||
識別子Scheme | WEKO | |||||
姓名 | ||||||
姓名 | Akiyama, Hisashi | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 新大院博(工)甲第217号 | |||||
書誌情報 | p. 1-111, 発行日 2006-03-23 | |||||
出版者 | ||||||
出版者 | 新潟大学大学院自然科学研究科 | |||||
著者版フラグ | ||||||
値 | author | |||||
学位名 | ||||||
学位名 | 博士(工学) | |||||
学位授与機関 | ||||||
学位授与機関名 | ||||||
学位授与機関名 | 新潟大学 | |||||
学位授与年月日 | ||||||
学位授与年月日 | 2006-03-23 | |||||
学位授与番号 | ||||||
学位授与番号 | 13101甲第2670号 | |||||
学位記番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 新大院博(工)甲第217号 |