ログイン
言語:

WEKO3

  • トップ
  • ランキング
To
lat lon distance
To

Field does not validate



インデックスリンク

インデックスツリー

メールアドレスを入力してください。

WEKO

One fine body…

WEKO

One fine body…

アイテム

{"_buckets": {"deposit": "f757d5e0-19f4-4335-977a-d2a4e9b76d8b"}, "_deposit": {"id": "3688", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "3688"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00003688", "sets": ["454", "425"]}, "item_5_alternative_title_1": {"attribute_name": "その他のタイトル", "attribute_value_mlt": [{"subitem_alternative_title": "Analysis of Stress Gradient in Ceramic Film by X-Ray Method"}]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1997-06", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "610", "bibliographicPageEnd": "1248", "bibliographicPageStart": "1243", "bibliographicVolumeNumber": "63", "bibliographic_titles": [{"bibliographic_title": "日本機械学会論文集. A編"}, {"bibliographic_title": "日本機械学会論文集. A編", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The sin^2 ψ diagram taken from a specimen with steep stress gradients beneath the surface shows nonlinearity because the X-ray penetration depth changes depending on the tilt angle. Stress gradients can be determined from this nonlinearity. Since ceramic materials have a deep X-ray peretration depth, the thickness of a thin ceramic film should have a significant effect on the nonlinearity of the sin^2 ψ method. In this paper, we propose a method of X-ray measurement of the stress gradient which takes into account of the effect of the thickness of a film under the assumption of linear stress gradients. The film made of silicon nitride was prepared. A 58 μm thick film specimen was carefully polished with diamond slurry to obtain sharp profiles of the X-ray diffraction. To apply the linear stress gradients, the specimen was bent on a cylinder. The stress distribution estimated by the present method agreed well with the applied bending stress, From the present study, stress gradients should be analyzed in terms of the weighted average stress on the basis of the whole intensity of the diffracted X-rays from thin films. when the thickness is less than six times the effective X-ray penetration depth.", "subitem_description_type": "Abstract"}]}, "item_5_full_name_3": {"attribute_name": "著者別名", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "44685", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Suzuki, Kenji"}]}, {"nameIdentifiers": [{"nameIdentifier": "44686", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Tanaka, Keisuke"}]}, {"nameIdentifiers": [{"nameIdentifier": "44687", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Sakaida, Yoshihisa"}]}]}, "item_5_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "日本機械学会"}]}, "item_5_relation_31": {"attribute_name": "異版である", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://ci.nii.ac.jp/naid/110002374159", "subitem_relation_type_select": "URI"}}]}, "item_5_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "日本機械学会 / 本文データは学会の許諾に基づくCiNiiからの複製である"}]}, "item_5_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AN0018742X", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "03875008", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "鈴木, 賢治"}], "nameIdentifiers": [{"nameIdentifier": "44682", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "田中, 啓介"}], "nameIdentifiers": [{"nameIdentifier": "44683", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "坂井田, 喜久"}], "nameIdentifiers": [{"nameIdentifier": "44684", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-30"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "9_0006.pdf", "filesize": [{"value": "508.2 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 508200.0, "url": {"label": "9_0006.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/3688/files/9_0006.pdf"}, "version_id": "1c609525-34d7-4523-ac93-1ce574c6ed40"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Residual Stress", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Experimental Stress Analysis", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Ceramics", "subitem_subject_scheme": "Other"}, {"subitem_subject": "X-ray Stress Measurement", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Thin Film", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Coating Film", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "X線によるセラミック膜の応力こう配の解析", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "X線によるセラミック膜の応力こう配の解析"}, {"subitem_title": "X線によるセラミック膜の応力こう配の解析", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["454", "425"], "permalink_uri": "http://hdl.handle.net/10191/5708", "pubdate": {"attribute_name": "公開日", "attribute_value": "2008-04-08"}, "publish_date": "2008-04-08", "publish_status": "0", "recid": "3688", "relation": {}, "relation_version_is_last": true, "title": ["X線によるセラミック膜の応力こう配の解析"], "weko_shared_id": null}
  1. 060 工学部
  2. 10 学術雑誌論文
  3. 10 査読済論文
  1. 0 資料タイプ別
  2. 01 学術雑誌論文

X線によるセラミック膜の応力こう配の解析

http://hdl.handle.net/10191/5708
http://hdl.handle.net/10191/5708
c38bdd78-72a0-406a-8b42-3edfaaee4125
名前 / ファイル ライセンス アクション
9_0006.pdf 9_0006.pdf (508.2 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2008-04-08
タイトル
タイトル X線によるセラミック膜の応力こう配の解析
タイトル
言語 en
タイトル X線によるセラミック膜の応力こう配の解析
言語
言語 jpn
キーワード
主題Scheme Other
主題 Residual Stress
キーワード
主題Scheme Other
主題 Experimental Stress Analysis
キーワード
主題Scheme Other
主題 Ceramics
キーワード
主題Scheme Other
主題 X-ray Stress Measurement
キーワード
主題Scheme Other
主題 Thin Film
キーワード
主題Scheme Other
主題 Coating Film
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ journal article
その他のタイトル
その他のタイトル Analysis of Stress Gradient in Ceramic Film by X-Ray Method
著者 鈴木, 賢治

× 鈴木, 賢治

WEKO 44682

鈴木, 賢治

Search repository
田中, 啓介

× 田中, 啓介

WEKO 44683

田中, 啓介

Search repository
坂井田, 喜久

× 坂井田, 喜久

WEKO 44684

坂井田, 喜久

Search repository
著者別名
識別子 44685
識別子Scheme WEKO
姓名 Suzuki, Kenji
著者別名
識別子 44686
識別子Scheme WEKO
姓名 Tanaka, Keisuke
著者別名
識別子 44687
識別子Scheme WEKO
姓名 Sakaida, Yoshihisa
抄録
内容記述タイプ Abstract
内容記述 The sin^2 ψ diagram taken from a specimen with steep stress gradients beneath the surface shows nonlinearity because the X-ray penetration depth changes depending on the tilt angle. Stress gradients can be determined from this nonlinearity. Since ceramic materials have a deep X-ray peretration depth, the thickness of a thin ceramic film should have a significant effect on the nonlinearity of the sin^2 ψ method. In this paper, we propose a method of X-ray measurement of the stress gradient which takes into account of the effect of the thickness of a film under the assumption of linear stress gradients. The film made of silicon nitride was prepared. A 58 μm thick film specimen was carefully polished with diamond slurry to obtain sharp profiles of the X-ray diffraction. To apply the linear stress gradients, the specimen was bent on a cylinder. The stress distribution estimated by the present method agreed well with the applied bending stress, From the present study, stress gradients should be analyzed in terms of the weighted average stress on the basis of the whole intensity of the diffracted X-rays from thin films. when the thickness is less than six times the effective X-ray penetration depth.
書誌情報 日本機械学会論文集. A編
en : 日本機械学会論文集. A編

巻 63, 号 610, p. 1243-1248, 発行日 1997-06
出版者
出版者 日本機械学会
ISSN
収録物識別子タイプ ISSN
収録物識別子 03875008
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AN0018742X
権利
権利情報 日本機械学会 / 本文データは学会の許諾に基づくCiNiiからの複製である
著者版フラグ
値 publisher
異版である
関連タイプ isVersionOf
識別子タイプ URI
関連識別子 http://ci.nii.ac.jp/naid/110002374159
戻る
0
views
See details
Views

Versions

Ver.1 2021-03-01 20:03:19.982309
Show All versions

Share

Mendeley Twitter Facebook Print Addthis

Cite as

エクスポート

OAI-PMH
  • OAI-PMH JPCOAR
  • OAI-PMH DublinCore
  • OAI-PMH DDI
Other Formats
  • JSON
  • BIBTEX

Confirm


Powered by WEKO3


Powered by WEKO3