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Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer
http://hdl.handle.net/10191/27476
http://hdl.handle.net/10191/27476a7e0bac7-8ea0-46e4-862f-726968341622
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
4919_339-346.pdf (449.1 kB)
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| Item type | 会議発表論文 / Conference Paper(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2014-06-20 | |||||
| タイトル | ||||||
| タイトル | Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer | |||||
| タイトル | ||||||
| タイトル | Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Interferometry | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | laser diode | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | two-wavelength method | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | feedback control | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | sinusoidal phase modulation | |||||
| 資源タイプ | ||||||
| 資源 | http://purl.org/coar/resource_type/c_5794 | |||||
| タイプ | conference paper | |||||
| 著者 |
Suzuki, Takamasa
× Suzuki, Takamasa× Sekimoto, Tatsuhiko× Sasaki, Osami |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We propose a new range finding technique that uses two-wavelength interferometry. The system we propose uses a single laser diode to realize a two-wavelength interferometer, which expands measurement range. The single light-source allows us to simplify the optical setup. Our device generates two independent interference signals with respect to the wavelengths generated by offset current. The external disturbances on these interference signals are eliminated by the feedback control. Although the feedback control eliminates disturbance as well as the information about the distance, we are able to detect the distance from the phase difference between those compensated interference signals. | |||||
| 内容記述 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. : Oct 2002, Shanghai, China | |||||
| 書誌情報 |
Proceedings of SPIE - the International Society for Optical Engineering en : Proceedings of SPIE - the International Society for Optical Engineering 巻 4919, p. 339-346, 発行日 2002-10 |
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| 出版者 | ||||||
| 出版者 | International Society for Optical Engineering, SPIE | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0277786X | |||||
| 書誌レコードID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AA10619755 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | info:doi/10.1117/12.465657 | |||||
| 権利 | ||||||
| 権利情報 | Copyright 2002 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. | |||||
| 著者版フラグ | ||||||
| 値 | publisher | |||||
