{"_buckets": {"deposit": "dfc1d9c7-3ddf-4748-99aa-4b286638230a"}, "_deposit": {"id": "31055", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31055"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031055"}, "item_8_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2002-10", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "346", "bibliographicPageStart": "339", "bibliographicVolumeNumber": "4919", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "We propose a new range finding technique that uses two-wavelength interferometry. The system we propose uses a single laser diode to realize a two-wavelength interferometer, which expands measurement range. The single light-source allows us to simplify the optical setup. Our device generates two independent interference signals with respect to the wavelengths generated by offset current. The external disturbances on these interference signals are eliminated by the feedback control. Although the feedback control eliminates disturbance as well as the information about the distance, we are able to detect the distance from the phase difference between those compensated interference signals.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "\u5185\u5bb9\u8a18\u8ff0", "attribute_value_mlt": [{"subitem_description": "Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. : Oct 2002, Shanghai, China", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.465657", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright 2002 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_8_select_19": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sekimoto, Tatsuhiko"}], "nameIdentifiers": [{"nameIdentifier": "169476", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "169477", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "filename": "4919_339-346.pdf", "filesize": [{"value": "449.1 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 4491000, "url": {"label": "4919_339-346.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31055/files/4919_339-346.pdf"}, "version_id": "4e2ac157-672b-49d7-859e-27aa880ee23d"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Interferometry", "subitem_subject_scheme": "Other"}, {"subitem_subject": "laser diode", "subitem_subject_scheme": "Other"}, {"subitem_subject": "two-wavelength method", "subitem_subject_scheme": "Other"}, {"subitem_subject": "feedback control", "subitem_subject_scheme": "Other"}, {"subitem_subject": "sinusoidal phase modulation", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer"}, {"subitem_title": "Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer", "subitem_title_language": "en"}]}, "item_type_id": "8", "owner": "1", "path": ["453/457", "423/435/1827"], "permalink_uri": "http://hdl.handle.net/10191/27476", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "31055", "relation": {}, "relation_version_is_last": true, "title": ["Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer"], "weko_shared_id": null}