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  1. 060 工学部
  2. 40 学会発表資料
  3. 06 SPIE
  1. 0 資料タイプ別
  2. 04 会議発表論文

Interference fringe analysis using wavelet transform

http://hdl.handle.net/10191/31154
http://hdl.handle.net/10191/31154
b156cc91-032d-4c3d-b255-3b7da4db8630
名前 / ファイル ライセンス アクション
7160_716002.pdf 7160_716002.pdf (1.2 MB)
Item type 会議発表論文 / Conference Paper(1)
公開日 2014-12-18
タイトル
タイトル Interference fringe analysis using wavelet transform
タイトル
言語 en
タイトル Interference fringe analysis using wavelet transform
言語
言語 eng
キーワード
主題Scheme Other
主題 Fringe analysis
キーワード
主題Scheme Other
主題 wavelet transform
キーワード
主題Scheme Other
主題 Fourier transform
キーワード
主題Scheme Other
主題 instantaneous image acquisition
資源タイプ
資源 http://purl.org/coar/resource_type/c_5794
タイプ conference paper
著者 Suzuki, Takamasa

× Suzuki, Takamasa

WEKO 39

Suzuki, Takamasa

Search repository
Kiyohara, Ryo

× Kiyohara, Ryo

WEKO 169405

Kiyohara, Ryo

Search repository
Ichikawa, Mika

× Ichikawa, Mika

WEKO 169406

Ichikawa, Mika

Search repository
Sasaki, Osami

× Sasaki, Osami

WEKO 169407

Sasaki, Osami

Search repository
抄録
内容記述タイプ Abstract
内容記述 Fringe analysis methods that employ wavelet transform are described. The performances of the methods are examined from the viewpoints of required calculation time and accuracy. Further, accuracies of calculations performed using linear and logarithmic scales in wavelet transform are compared. Experimental results show that wavelet signal processing is effective in measuring profiles having large and gradual asperities.
内容記述
内容記述タイプ Other
内容記述 Optoelectronic measurement technology and applications : 16-19 November 2008 : Beijing, China.
書誌情報 Proceedings of SPIE - the International Society for Optical Engineering
en : Proceedings of SPIE - the International Society for Optical Engineering

巻 7160, p. 716002-1-716002-12, 発行日 2008-11
出版者
出版者 International Society for Optical Engineering, SPIE
ISSN
収録物識別子タイプ ISSN
収録物識別子 0277786X
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA10619755
DOI
識別子タイプ DOI
関連識別子 info:doi/10.1117/12.817853
権利
権利情報 Copyright(C)2008 Society of Photo-Optical Instrumentation Engineers
著者版フラグ
値 publisher
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