{"_buckets": {"deposit": "cda91896-c63d-445b-ab6f-9c21b3380c14"}, "_deposit": {"id": "31035", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31035"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031035"}, "item_8_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2008-11", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "716002-12", "bibliographicPageStart": "716002-1", "bibliographicVolumeNumber": "7160", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "Fringe analysis methods that employ wavelet transform are described. The performances of the methods are examined from the viewpoints of required calculation time and accuracy. Further, accuracies of calculations performed using linear and logarithmic scales in wavelet transform are compared. Experimental results show that wavelet signal processing is effective in measuring profiles having large and gradual asperities.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "\u5185\u5bb9\u8a18\u8ff0", "attribute_value_mlt": [{"subitem_description": "Optoelectronic measurement technology and applications : 16-19 November 2008 : Beijing, China.", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.817853", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright(C)2008 Society of Photo-Optical Instrumentation Engineers"}]}, "item_8_select_19": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kiyohara, Ryo"}], "nameIdentifiers": [{"nameIdentifier": "169405", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ichikawa, Mika"}], "nameIdentifiers": [{"nameIdentifier": "169406", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "169407", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "filename": "7160_716002.pdf", "filesize": [{"value": "1.2 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 12000000, "url": {"label": "7160_716002.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31035/files/7160_716002.pdf"}, "version_id": "68741c0c-93fd-4db7-b425-833a71f6a8bd"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Fringe analysis", "subitem_subject_scheme": "Other"}, {"subitem_subject": "wavelet transform", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Fourier transform", "subitem_subject_scheme": "Other"}, {"subitem_subject": "instantaneous image acquisition", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Interference fringe analysis using wavelet transform", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Interference fringe analysis using wavelet transform"}, {"subitem_title": "Interference fringe analysis using wavelet transform", "subitem_title_language": "en"}]}, "item_type_id": "8", "owner": "1", "path": ["453/457", "423/435/1827"], "permalink_uri": "http://hdl.handle.net/10191/31154", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2014-12-18"}, "publish_date": "2014-12-18", "publish_status": "0", "recid": "31035", "relation": {}, "relation_version_is_last": true, "title": ["Interference fringe analysis using wavelet transform"], "weko_shared_id": null}