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  1. 020 教育学部
  2. 10 学術雑誌論文
  3. 10 査読済論文
  1. 0 資料タイプ別
  2. 01 学術雑誌論文

アナライザを用いたひずみスキャニング法の表面効果の補正

http://hdl.handle.net/10191/18172
http://hdl.handle.net/10191/18172
76b2a5fe-ad87-4a0b-96bc-61d60046acd1
名前 / ファイル ライセンス アクション
55_101.pdf 55_101.pdf (614.5 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2012-06-04
タイトル
タイトル アナライザを用いたひずみスキャニング法の表面効果の補正
タイトル
言語 en
タイトル アナライザを用いたひずみスキャニング法の表面効果の補正
言語
言語 jpn
キーワード
主題Scheme Other
主題 Residual stress
キーワード
主題Scheme Other
主題 Hard synchrotron X-ray
キーワード
主題Scheme Other
主題 X-ray stress measurement
キーワード
主題Scheme Other
主題 Strain scanning method
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ journal article
その他のタイトル
その他のタイトル Correction of Surface Aberration in Strain Scanning Method with Analyzer
著者 菖蒲, 敬久

× 菖蒲, 敬久

WEKO 39792

菖蒲, 敬久

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水木, 純一郎

× 水木, 純一郎

WEKO 39793

水木, 純一郎

Search repository
鈴木, 賢治

× 鈴木, 賢治

WEKO 39794

鈴木, 賢治

Search repository
秋庭, 義明

× 秋庭, 義明

WEKO 39795

秋庭, 義明

Search repository
田中, 啓介

× 田中, 啓介

WEKO 39796

田中, 啓介

Search repository
著者別名
識別子 39797
識別子Scheme WEKO
姓名 Shobu, Takahisa
著者別名
識別子 39798
識別子Scheme WEKO
姓名 Mizuki, Junichiro
著者別名
識別子 39799
識別子Scheme WEKO
姓名 Suzuki, Kenji
著者別名
識別子 39800
識別子Scheme WEKO
姓名 Akiniwa, Yoshiaki
著者別名
識別子 39801
識別子Scheme WEKO
姓名 Tanaka, Keisuke
抄録
内容記述タイプ Abstract
内容記述 When a gauge volume sank below a specimen surface, the diffraction angle shifts. Thus, it is required to correct the surface aberration. For the annealed specimen of S45C, the shift in the diffraction angle was investigated using a strain scanning method with Ge (111) analyzer. This phenomenon was caused by the difference in the centroid between the geometric and the instrumental gauge volumes. This difference is explained by the following factors; 1) the change in the gauge volume by the divergence of the analyzer, 2)the X-ray penetration depth, 3)the gap of the centre line between the double receiving slits due to mis-setting the analyzer. As a result, the correcting method considered into these factors was proposed. For the shot-peened specimens of S45C, the diffraction angles were measured and corrected by our method. The distribution of the residual stress agreed with that obtained by the removal method.
書誌情報 材料
en : 材料

巻 55, 号 1, p. 101-108, 発行日 2006-01
出版者
出版者 日本材料学会
ISSN
収録物識別子タイプ ISSN
収録物識別子 05145163
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AN00096175
著者版フラグ
値 publisher
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