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  1. 020 教育学部
  2. 10 学術雑誌論文
  3. 10 査読済論文
  1. 0 資料タイプ別
  2. 01 学術雑誌論文

高エネルギー放射光白色X線を用いた材料内部ひずみ測定

http://hdl.handle.net/10191/18063
99fa0b30-d379-4db0-910b-0f549cec9837
名前 / ファイル ライセンス アクション
56_985.pdf 56_985.pdf (607.2 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2012-05-31
タイトル
タイトル 高エネルギー放射光白色X線を用いた材料内部ひずみ測定
タイトル
言語 en
タイトル 高エネルギー放射光白色X線を用いた材料内部ひずみ測定
言語
言語 jpn
キーワード
主題Scheme Other
主題 Strain measurement
キーワード
主題Scheme Other
主題 High energy synchrotron radiation X-rays
キーワード
主題Scheme Other
主題 Internal strain
キーワード
主題Scheme Other
主題 Energy dispersive method
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ journal article
その他のタイトル
その他のタイトル Measurement of Internal strain in Materials Using High Energy Synchrotron Radiation White X-Rays
著者 柴野, 純一

× 柴野, 純一

WEKO 39758

柴野, 純一

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菖蒲, 敬久

× 菖蒲, 敬久

WEKO 39759

菖蒲, 敬久

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鈴木, 賢治

× 鈴木, 賢治

WEKO 39760

鈴木, 賢治

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平田, 智之

× 平田, 智之

WEKO 39761

平田, 智之

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金子, 洋

× 金子, 洋

WEKO 39762

金子, 洋

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小林, 道明

× 小林, 道明

WEKO 39763

小林, 道明

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著者別名
識別子
識別子 39764
識別子Scheme WEKO
姓名
姓名 Shibano, Jun-ichi
著者別名
識別子
識別子 39765
識別子Scheme WEKO
姓名
姓名 Shobu, Takahisa
著者別名
識別子
識別子 39766
識別子Scheme WEKO
姓名
姓名 Suzuki, Kenji
著者別名
識別子
識別子 39767
識別子Scheme WEKO
姓名
姓名 Hirata, Tomoyuki
著者別名
識別子
識別子 39768
識別子Scheme WEKO
姓名
姓名 Kaneko, Hiroshi
著者別名
識別子
識別子 39769
識別子Scheme WEKO
姓名
姓名 Kobayashi, Michiaki
抄録
内容記述タイプ Abstract
内容記述 This paper presents a basic research on a measurement of strain in the bulk of materials by using high energy white X-rays from a synchrotron radiation source of Spring-8, WEL-TEN780E(JIS G3128 SHY685) whose grain size was 13μm was used as a specimen shaped into G type. The specimen was loaded with-bending. The white X-ray beam, which has a height of 50μm and width of 300μm , was incident in the specimen with the Bragg angle θof 5degree. Bending strain at the surface of specimen was measured by a strain gauge. The strain in the loading direction of the specimen was obtained directly from a rate of change of peak energy of transmitted X-rays through the thickness. As a result, the internal strain of SHY685 of 5mm thickness could be evaluated using white X-rays which range of energy from 60keV to 150keV. It is suitable for the measurement with sufficient accuracy to include more than or equal to 5000 grains of crystal in the gauge volume. The measurement error of strain could be decreased by using the diffracted X-rays with high energy. Furthermore, the measurement with a high degree of accuracy was accomplished using α-Fe321 diffraction in this material, The results showed that the high energy while X-ray is effective for internal strain measurements.
書誌情報 材料
en : 材料

巻 56, 号 10, p. 985-992, 発行日 2007-10
出版者
出版者 日本材料学会
ISSN
収録物識別子タイプ ISSN
収録物識別子 05145163
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AN00096175
著者版フラグ
値 publisher
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