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X-ray Study of Residual Stress Distribution of Ground Ceramics
http://hdl.handle.net/10191/18179
http://hdl.handle.net/10191/181792004a37d-6435-4995-8e02-9619c1387c70
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
41-3_422.pdf (1.9 MB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2012-06-04 | |||||
| タイトル | ||||||
| タイトル | X-ray Study of Residual Stress Distribution of Ground Ceramics | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Ceramics | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Residual Stress | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Grinding | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | X-ray Stress Measurement | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Dislocation | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Glancing Incidence X-ray Diffraction Method | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Transmission Electron Microscopy | |||||
| 資源タイプ | ||||||
| 資源 | http://purl.org/coar/resource_type/c_6501 | |||||
| タイプ | journal article | |||||
| 著者 |
Sakaida, Yoshihisa
× Sakaida, Yoshihisa× Tanaka, Keisuke× Ikuhara, Yuichi× Suzuki, Kenji |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The residual stress distribution of ground ceramics was determined from the eigen strain distributed near the ground surface. The eigen strain of ground ceramics was tensile, and exponentially decreased with the distance from the surface. The residual stress distribution is given as a superposition of an exponential function of compression and a linear function. It is found that the actual residual stress distribution can be approximated by an exponential function of compression because the magnitude of tensile residual stress is negligibly small compared to the compressive residual stress. In the experiments, the diffraction angle was measured on ground silicon nitride for a wide range of sin^2Ψ using the glancing incidence X-ray diffraction technique. A strong nonlinearity was found in the 2θ-sin^2Ψ diagram at very highΨ-angles. From the analysis of nonlinearity, the residual stress distribution was determined. The residual stress distribution of silicon nitride coincided with the distribution calculated from the eigen strain distribution. Transmission electron microscopy was used to clarify the origin of generation of the residual stress. Both strain contrasts and microcracks were observed below the ground surface ; straight dislocations were also observed within silicon nitride grains near the ground surface. | |||||
| 言語 | en | |||||
| 書誌情報 |
en : JSME International Journal. Series A, Solid mechanics and material engineering. 巻 41, 号 3, p. 422-429, 発行日 1998 |
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| 出版者 | ||||||
| 出版者 | Japan Society of Mechanical Engineers | |||||
| 言語 | en | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 1344-7912 | |||||
| 書誌レコードID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AA11179396 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | http://doi.org/10.1299/jsmea.41.422 | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 著者版フラグ | ||||||
| 値 | publisher | |||||
