{"_buckets": {"deposit": "ab4a076e-9000-4ab9-a94f-08336d0a50c4"}, "_deposit": {"id": "1547", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "1547"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00001547", "sets": ["454", "425"]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1989-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "20", "bibliographicPageEnd": "4410", "bibliographicPageStart": "4407", "bibliographicVolumeNumber": "28", "bibliographic_titles": [{"bibliographic_title": "Applied Optics"}, {"bibliographic_title": "Applied Optics", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "We propose a new type phase locked interferometer which uses tunability of the wavelength of a laser diode. The phase lock is achieved by controlling the injection current of the laser diode. A CCD image sensor is used as a photodetector to scan electrically a measuring point along the surface of the object. Since this interferometer uses no mechanical elements such as a piezoelectric transducer and galvanomirror, the measurement accuracy is not limited by the mechanical properties. The characteristics of the feedback control system for the phase lock are examined through measurements of surface profiles of the diamond-turned aluminum disks.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Optical Society of America"}]}, "item_5_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1364/AO.28.004407", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© 1989 Optical Society of America"}, {"subitem_rights": "This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.28.004407. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]}, "item_5_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00543409", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00036935", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "4230", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Maruyama, Takeo"}], "nameIdentifiers": [{"nameIdentifier": "4231", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-29"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "28_20_4407-4410.pdf", "filesize": [{"value": "406.3 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 406300.0, "url": {"label": "28_20_4407-4410.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/1547/files/28_20_4407-4410.pdf"}, "version_id": "bc79ac53-d009-42a7-9aa6-d0103f520fd6"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Phase locked laser diode interferometry for surface profile measurement", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Phase locked laser diode interferometry for surface profile measurement"}, {"subitem_title": "Phase locked laser diode interferometry for surface profile measurement", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["454", "425"], "permalink_uri": "http://hdl.handle.net/10191/27501", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "1547", "relation": {}, "relation_version_is_last": true, "title": ["Phase locked laser diode interferometry for surface profile measurement"], "weko_shared_id": null}