{"_buckets": {"deposit": "2a20cc1b-f74b-4890-9fcd-45ddc526fc78"}, "_deposit": {"id": "1535", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "1535"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00001535", "sets": ["454", "425"]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1997-09", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "25", "bibliographicPageEnd": "6195", "bibliographicPageStart": "6190", "bibliographicVolumeNumber": "36", "bibliographic_titles": [{"bibliographic_title": "Applied Optics"}, {"bibliographic_title": "Applied Optics", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Based on the idea of measuring small rotation angles with a parallel interference pattern (PIP), a method is developed to measure large rotation angles accurately. Two parallel PIP’s that have different periods are used to measure a rotation angle of an object. The measurement made with a small-period PIP provides a high accuracy, and the measurement made with a large-period PIP provides a wide range. An accurate measurement for wide-range angles is made by combining the two measured values. The accuracy of the phase detection is determined by the periods of two PIP’s. Rotation angles from approximately −30 to 30 arc min can be measured with an accuracy of 0.2 arc sec. Analytical results are supported by experimental results.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Optical Society of America"}]}, "item_5_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1364/AO.36.006190", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© 1997 Optical Society of America"}, {"subitem_rights": "This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.36.006190. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]}, "item_5_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00543409", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00036935", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Dai, Xiaoli"}], "nameIdentifiers": [{"nameIdentifier": "4187", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "4188", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Greivenkamp, John E."}], "nameIdentifiers": [{"nameIdentifier": "4189", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-29"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "36_25_6190-6195.pdf", "filesize": [{"value": "673.8 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 673800.0, "url": {"label": "36_25_6190-6195.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/1535/files/36_25_6190-6195.pdf"}, "version_id": "54815512-e450-4d36-899c-53f9ad98e211"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Wide range", "subitem_subject_scheme": "Other"}, {"subitem_subject": "high accuracy", "subitem_subject_scheme": "Other"}, {"subitem_subject": "rotation angles", "subitem_subject_scheme": "Other"}, {"subitem_subject": "interferometry", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns"}, {"subitem_title": "High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["454", "425"], "permalink_uri": "http://hdl.handle.net/10191/27527", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "1535", "relation": {}, "relation_version_is_last": true, "title": ["High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns"], "weko_shared_id": null}