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  1. 020 教育学部
  2. 10 学術雑誌論文
  3. 10 査読済論文
  1. 0 資料タイプ別
  2. 01 学術雑誌論文

セラミックスの研削残留応力分布のX線的研究

http://hdl.handle.net/10191/18182
http://hdl.handle.net/10191/18182
0639a4a0-f42e-4e6b-a4e9-0367934e6274
名前 / ファイル ライセンス アクション
63-612_1681.pdf 63-612_1681.pdf (1.2 MB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2012-06-04
タイトル
タイトル セラミックスの研削残留応力分布のX線的研究
タイトル
言語 en
タイトル セラミックスの研削残留応力分布のX線的研究
言語
言語 jpn
キーワード
主題Scheme Other
主題 Ceramics
キーワード
主題Scheme Other
主題 Residual Stress
キーワード
主題Scheme Other
主題 Grinding
キーワード
主題Scheme Other
主題 X-ray Stress Measurement
キーワード
主題Scheme Other
主題 Dislocation
キーワード
主題Scheme Other
主題 Glancing Incidence X-ray Diffraction Method
キーワード
主題Scheme Other
主題 Transmission Electron Microscopy
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ journal article
その他のタイトル
その他のタイトル X-ray Study of Residual Stress Distribution of Ground Ceramics
著者 坂井田, 喜久

× 坂井田, 喜久

WEKO 44674

坂井田, 喜久

Search repository
田中, 啓介

× 田中, 啓介

WEKO 44675

田中, 啓介

Search repository
幾原, 雄一

× 幾原, 雄一

WEKO 44676

幾原, 雄一

Search repository
鈴木, 賢治

× 鈴木, 賢治

WEKO 44677

鈴木, 賢治

Search repository
著者別名
識別子 44678
識別子Scheme WEKO
姓名 Sakaida, Yoshihisa
著者別名
識別子 44679
識別子Scheme WEKO
姓名 Tanaka, Keisuke
著者別名
識別子 44680
識別子Scheme WEKO
姓名 Ikuhara, Yuichi
著者別名
識別子 44681
識別子Scheme WEKO
姓名 Suzuki, Kenji
抄録
内容記述タイプ Abstract
内容記述 The residual stress distribution of ground ceramics was determined from the eigen strain existing in the ground surface. The eigen strain of ground ceramics was tensile, and exponentially decreased with the distance from the surface. The residual stress distribution is given as a superposition of all exponential function of compression and a linear function. It is found that the actual residual stress distribution call be approximated by a compressive exponential function because the magnitude of tensile residual stress is negligibly small compared to the compressive residual stress. In the experiments, the diffraction angle was measured on ground silicon nitride for a wide range of sin^3Φ using the glancing incidence X-ray diffraction technique. A strong nonlinearity was found in the 2θ-sin^2Φ diagram at very high Φ-angles. From the analysis of nonlinearity, the residual stress distribution was determined. The residual stress distribution of silicon nitride coincided with the distribution calculated from the eigen strain distribution. Transmission electron microscopy was used to clarify the origin of generation of the residual stress. Both strain contrasts and microcracks were observed below the ground surface : straight dislocations were also observed within silicon nitride grains near the ground surface.
書誌情報 日本機械学会論文集. A編
en : 日本機械学会論文集. A編

巻 63, 号 612, p. 1681-1687, 発行日 1997-08
出版者
出版者 日本機械学会
ISSN
収録物識別子タイプ ISSN
収録物識別子 03875008
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AN0018742X
著者版フラグ
値 publisher
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