WEKO3
アイテム
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セラミックスの研削残留応力分布のX線的研究
http://hdl.handle.net/10191/18182
http://hdl.handle.net/10191/181820639a4a0-f42e-4e6b-a4e9-0367934e6274
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2012-06-04 | |||||
タイトル | ||||||
タイトル | セラミックスの研削残留応力分布のX線的研究 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | セラミックスの研削残留応力分布のX線的研究 | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Ceramics | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Residual Stress | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Grinding | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | X-ray Stress Measurement | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Dislocation | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Glancing Incidence X-ray Diffraction Method | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Transmission Electron Microscopy | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
その他のタイトル | ||||||
その他のタイトル | X-ray Study of Residual Stress Distribution of Ground Ceramics | |||||
著者 |
坂井田, 喜久
× 坂井田, 喜久× 田中, 啓介× 幾原, 雄一× 鈴木, 賢治 |
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著者別名 | ||||||
識別子 | 44678 | |||||
識別子Scheme | WEKO | |||||
姓名 | Sakaida, Yoshihisa | |||||
著者別名 | ||||||
識別子 | 44679 | |||||
識別子Scheme | WEKO | |||||
姓名 | Tanaka, Keisuke | |||||
著者別名 | ||||||
識別子 | 44680 | |||||
識別子Scheme | WEKO | |||||
姓名 | Ikuhara, Yuichi | |||||
著者別名 | ||||||
識別子 | 44681 | |||||
識別子Scheme | WEKO | |||||
姓名 | Suzuki, Kenji | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | The residual stress distribution of ground ceramics was determined from the eigen strain existing in the ground surface. The eigen strain of ground ceramics was tensile, and exponentially decreased with the distance from the surface. The residual stress distribution is given as a superposition of all exponential function of compression and a linear function. It is found that the actual residual stress distribution call be approximated by a compressive exponential function because the magnitude of tensile residual stress is negligibly small compared to the compressive residual stress. In the experiments, the diffraction angle was measured on ground silicon nitride for a wide range of sin^3Φ using the glancing incidence X-ray diffraction technique. A strong nonlinearity was found in the 2θ-sin^2Φ diagram at very high Φ-angles. From the analysis of nonlinearity, the residual stress distribution was determined. The residual stress distribution of silicon nitride coincided with the distribution calculated from the eigen strain distribution. Transmission electron microscopy was used to clarify the origin of generation of the residual stress. Both strain contrasts and microcracks were observed below the ground surface : straight dislocations were also observed within silicon nitride grains near the ground surface. | |||||
書誌情報 |
日本機械学会論文集. A編 en : 日本機械学会論文集. A編 巻 63, 号 612, p. 1681-1687, 発行日 1997-08 |
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出版者 | ||||||
出版者 | 日本機械学会 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 03875008 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN0018742X | |||||
著者版フラグ | ||||||
値 | publisher |