{"_buckets": {"deposit": "8da4b831-61c2-405a-b6e7-92fd0f97ee1e"}, "_deposit": {"id": "3687", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "3687"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00003687", "sets": ["454", "502"]}, "item_5_alternative_title_1": {"attribute_name": "その他のタイトル", "attribute_value_mlt": [{"subitem_alternative_title": "X-ray Study of Residual Stress Distribution of Ground Ceramics"}]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1997-08", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "612", "bibliographicPageEnd": "1687", "bibliographicPageStart": "1681", "bibliographicVolumeNumber": "63", "bibliographic_titles": [{"bibliographic_title": "日本機械学会論文集. A編"}, {"bibliographic_title": "日本機械学会論文集. A編", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The residual stress distribution of ground ceramics was determined from the eigen strain existing in the ground surface. The eigen strain of ground ceramics was tensile, and　exponentially decreased with the distance from the surface. The residual stress distribution is given as a superposition of all exponential function of compression and a linear function. It is found that the actual residual stress distribution call be approximated by a compressive exponential function because the magnitude of tensile residual stress is negligibly small compared to the compressive residual stress. In the experiments, the diffraction angle was measured on ground silicon nitride for a wide range of sin^3Φ using the glancing incidence X-ray diffraction technique. A strong nonlinearity was found in the 2θ-sin^2Φ diagram at very high Φ-angles. From the analysis of nonlinearity, the residual stress distribution was determined. The residual stress distribution of silicon nitride coincided with the distribution calculated from the eigen strain distribution. Transmission electron microscopy was used to clarify the origin of generation of the residual stress. Both strain contrasts and microcracks were observed below the ground surface : straight dislocations were also observed within silicon nitride grains near the ground surface.", "subitem_description_type": "Abstract"}]}, "item_5_full_name_3": {"attribute_name": "著者別名", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "44678", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Sakaida, Yoshihisa"}]}, {"nameIdentifiers": [{"nameIdentifier": "44679", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Tanaka, Keisuke"}]}, {"nameIdentifiers": [{"nameIdentifier": "44680", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Ikuhara, Yuichi"}]}, {"nameIdentifiers": [{"nameIdentifier": "44681", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Suzuki, Kenji"}]}]}, "item_5_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "日本機械学会"}]}, "item_5_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AN0018742X", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "03875008", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "坂井田, 喜久"}], "nameIdentifiers": [{"nameIdentifier": "44674", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "田中, 啓介"}], "nameIdentifiers": [{"nameIdentifier": "44675", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "幾原, 雄一"}], "nameIdentifiers": [{"nameIdentifier": "44676", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "鈴木, 賢治"}], "nameIdentifiers": [{"nameIdentifier": "44677", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-30"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "63-612_1681.pdf", "filesize": [{"value": "1.2 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1200000.0, "url": {"label": "63-612_1681.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/3687/files/63-612_1681.pdf"}, "version_id": "237ba222-0b53-4111-a8cb-f0c01c0f82a7"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Ceramics", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Residual Stress", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Grinding", "subitem_subject_scheme": "Other"}, {"subitem_subject": "X-ray Stress Measurement", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Dislocation", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Glancing Incidence X-ray Diffraction Method", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Transmission Electron Microscopy", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "セラミックスの研削残留応力分布のＸ線的研究", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "セラミックスの研削残留応力分布のＸ線的研究"}, {"subitem_title": "セラミックスの研削残留応力分布のＸ線的研究", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["454", "502"], "permalink_uri": "http://hdl.handle.net/10191/18182", "pubdate": {"attribute_name": "公開日", "attribute_value": "2012-06-04"}, "publish_date": "2012-06-04", "publish_status": "0", "recid": "3687", "relation": {}, "relation_version_is_last": true, "title": ["セラミックスの研削残留応力分布のＸ線的研究"], "weko_shared_id": null}