@article{oai:niigata-u.repo.nii.ac.jp:00032169,
 author = {Yamaguchi, Yoshio and Minetani, Yuto and Umemura, Maito and Yamada, Hiroyoshi},
 issue = {7},
 journal = {IEICE Transactions on Communications, IEICE Transactions on Communications},
 month = {Jul},
 note = {This paper presents a conifer and broad-leaf tree classification scheme that processes high resolution polarimetric synthetic aperture data above X-band. To validate the proposal, fully polarimetric measurements are conducted in a precisely controlled environment to examine the difference between the scattering mechanisms of conifer and broad-leaf trees at 15 GHz. With 3.75 cm range resolution, scattering matrices of two tree types were measured by a vector network analyzer. Polarimetric analyses using the 4-component scattering power decomposition and alpha-bar angle of eigenvalue decomposition yielded clear distinction between the two tree types. This scheme was also applied to an X-band Pi-SAR2 data set. The results confirm that it is possible to distinguish between tree types using fully polarimetric and high-resolution data above X-band.},
 pages = {1345--1350},
 title = {Experimental Validation of Conifer and Broad-Leaf Tree Classification Using High Resolution PolSAR Data above X-Band},
 volume = {E102-B},
 year = {2019}
}