{"created":"2021-03-01T06:37:22.163378+00:00","id":31217,"links":{},"metadata":{"_buckets":{"deposit":"7172dbfb-8b63-4ea8-8d81-a3eb96f19073"},"_deposit":{"id":"31217","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31217"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031217","sets":["423:435:1836","453:457"]},"item_8_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Evalutional Method of the Material Characteristics for the Small Size Electronic Using Ultramicro Hardness Test"}]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"40","bibliographicPageStart":"39","bibliographicVolumeNumber":"000-4","bibliographic_titles":[{"bibliographic_title":"山梨講演会講演論文集"},{"bibliographic_title":"山梨講演会講演論文集","bibliographic_titleLang":"en"}]}]},"item_8_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"170461","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ishibashi, Tatsuya"}]},{"nameIdentifiers":[{"nameIdentifier":"170462","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Amano, Hirohisa"}]},{"nameIdentifiers":[{"nameIdentifier":"170463","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ohki, Motofumi"}]},{"nameIdentifiers":[{"nameIdentifier":"170464","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Fujitsuka, Masayuki"}]},{"nameIdentifiers":[{"nameIdentifier":"170465","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yosikawa, Yusuke"}]},{"nameIdentifiers":[{"nameIdentifier":"170466","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Hamagishi, Kenichirou"}]}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本機械学会"}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"日本機械学会"}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10553987","subitem_source_identifier_type":"NCID"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石橋, 達弥"}],"nameIdentifiers":[{"nameIdentifier":"170455","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"天野, 裕久"}],"nameIdentifiers":[{"nameIdentifier":"170456","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大木, 基史"}],"nameIdentifiers":[{"nameIdentifier":"170457","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤塚, 将行"}],"nameIdentifiers":[{"nameIdentifier":"170458","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"吉川, 裕輔"}],"nameIdentifiers":[{"nameIdentifier":"170459","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱岸, 憲一朗"}],"nameIdentifiers":[{"nameIdentifier":"170460","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"4_0145.pdf","filesize":[{"value":"509.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"4_0145.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31217/files/4_0145.pdf"},"version_id":"3e516c0b-19fb-4c61-a2f1-46fb90ba3296"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Ultramicro Hardness Test","subitem_subject_scheme":"Other"},{"subitem_subject":"Young's Modulus","subitem_subject_scheme":"Other"},{"subitem_subject":"Material Characteristics","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"超微小硬さ試験を利用した微小電子部品の材料特性評価法","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"超微小硬さ試験を利用した微小電子部品の材料特性評価法"},{"subitem_title":"超微小硬さ試験を利用した微小電子部品の材料特性評価法","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1836"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-04-08"},"publish_date":"2008-04-08","publish_status":"0","recid":"31217","relation_version_is_last":true,"title":["超微小硬さ試験を利用した微小電子部品の材料特性評価法"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:01:44.607747+00:00"}