{"created":"2021-03-01T06:37:12.270049+00:00","id":31070,"links":{},"metadata":{"_buckets":{"deposit":"6dcda63a-58a0-4426-b31e-fd8a6516647a"},"_deposit":{"id":"31070","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31070"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031070","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1997-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"199","bibliographicPageStart":"192","bibliographicVolumeNumber":"2993","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A new type of two-wavelength interferometer for the measurement of absolute distance is described. Since the wavelength of the laser diode is temporally multiplexed, only one laser diode light-source is required, thus eliminating the necessity of aligning two independent optical axes. Absolute distance is calculated from the difference of the phases in the interference signals generated by each wavelength. The self-correlation function is applicable in our system for detecting this phase- difference between two kinds of interference signals, thereby, the signal processing is very simple and there is a possibility that the real-time distance measurement becomes possible in our new method.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Lasers as tools for manufacturing 2 : Conference : Feb 1997, San Jose, CA","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.270028","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1997 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Aizaki, Takatsugu"}],"nameIdentifiers":[{"nameIdentifier":"169535","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169536","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Maruyama, Takeo"}],"nameIdentifiers":[{"nameIdentifier":"169537","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"2993_192-199.pdf","filesize":[{"value":"454.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"2993_192-199.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31070/files/2993_192-199.pdf"},"version_id":"00059996-9b8a-4eb9-b6ae-0f4ad833d7a0"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"interferometer","subitem_subject_scheme":"Other"},{"subitem_subject":"laser diode","subitem_subject_scheme":"Other"},{"subitem_subject":"two-wavelength","subitem_subject_scheme":"Other"},{"subitem_subject":"equivalent wavelength","subitem_subject_scheme":"Other"},{"subitem_subject":"absolute distance measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Two-wavelength laser diode interferometer with a time-sharing heterodyne modulation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Two-wavelength laser diode interferometer with a time-sharing heterodyne modulation"},{"subitem_title":"Two-wavelength laser diode interferometer with a time-sharing heterodyne modulation","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"31070","relation_version_is_last":true,"title":["Two-wavelength laser diode interferometer with a time-sharing heterodyne modulation"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:01:36.287870+00:00"}