{"created":"2021-03-01T06:37:11.799702+00:00","id":31063,"links":{},"metadata":{"_buckets":{"deposit":"351ddabb-c81f-42f5-9076-e015d76683a0"},"_deposit":{"id":"31063","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31063"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031063","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999-09","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"21","bibliographicPageStart":"14","bibliographicVolumeNumber":"3835","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A system of small rotation angle measurement based on the fringe projection is proposed and demonstrated. This system has potential for a broad range of uses and a robustness for the external disturbances, because it requires no coherent light. The setup is very simple and applicable to the automatic on-line measurement. Several measurements indicate a sensitivity of 3 arcsec.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Three-dimensional imaging, optical metrology, and inspection 5 : Conference : Sep 1999, Boston, MA","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.370258","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakamura, Hideki"}],"nameIdentifiers":[{"nameIdentifier":"169506","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Greivenkamp, John E."}],"nameIdentifiers":[{"nameIdentifier":"169507","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169508","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"3835_14-21.pdf","filesize":[{"value":"493.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"3835_14-21.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31063/files/3835_14-21.pdf"},"version_id":"d9241bfb-a897-4391-a347-eb35c79e02ca"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"rotation angle measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"image processing","subitem_subject_scheme":"Other"},{"subitem_subject":"fringe projection","subitem_subject_scheme":"Other"},{"subitem_subject":"n-line measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Small rotation angle measurement using an imaging method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Small rotation angle measurement using an imaging method"},{"subitem_title":"Small rotation angle measurement using an imaging method","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"31063","relation_version_is_last":true,"title":["Small rotation angle measurement using an imaging method"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:01:36.826613+00:00"}