{"created":"2021-03-01T06:37:10.728481+00:00","id":31047,"links":{},"metadata":{"_buckets":{"deposit":"5dde6611-c725-43c4-b4d6-caa6ebb7185a"},"_deposit":{"id":"31047","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31047"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031047","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-02","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"126","bibliographicPageStart":"120","bibliographicVolumeNumber":"5265","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper describes a range-finder that uses two feedback loops. Each feedback loop is respectively used to control the phase and the modulation-amplitude in a sinusoidal phase-modulating interference signal. It enables us to perform unambiguous measurement and real-time processing on the interference signal. Also external disturbance superimposed on the interference signal is eliminated by the feedback control. A distributed-Bragg-reflector laser diode that has wide range in wavelength-tuning allows us to improve the measurement accuracy.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003 : Providence, Rhode Island, USA. : Oct 2003, Providence, RI","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.518640","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 2004 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Iwana, Tatsuo"}],"nameIdentifiers":[{"nameIdentifier":"169449","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169450","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"5265_120-126.pdf","filesize":[{"value":"425.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"5265_120-126.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31047/files/5265_120-126.pdf"},"version_id":"27444511-ae2f-4b90-b20d-f7a6c77dca60"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"interferometry","subitem_subject_scheme":"Other"},{"subitem_subject":"distributed-Bragg-reflector laser diode","subitem_subject_scheme":"Other"},{"subitem_subject":"feedback control","subitem_subject_scheme":"Other"},{"subitem_subject":"sinusoidal phase modulation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Modulation-amplitude-locked laser diode interferometry for distance measurement","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Modulation-amplitude-locked laser diode interferometry for distance measurement"},{"subitem_title":"Modulation-amplitude-locked laser diode interferometry for distance measurement","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"31047","relation_version_is_last":true,"title":["Modulation-amplitude-locked laser diode interferometry for distance measurement"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:01:35.620223+00:00"}