{"created":"2021-03-01T06:37:10.529411+00:00","id":31044,"links":{},"metadata":{"_buckets":{"deposit":"d071654c-2392-4b1d-9176-0335f8cfbddc"},"_deposit":{"id":"31044","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31044"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031044","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-08","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"60240Q-6","bibliographicPageStart":"60240Q-1","bibliographicVolumeNumber":"6024","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A method for measuring diameters of metal cylinders is proposed. In this method a sinusoidally vibrating interference pattern (SVIP) of 100μm-period is used to generate an exact spatial scale along x-axis. Detection of the amplitude and the phase of the SVIP are carried out easily and exactly with sinusoidal phase-modulating interferometry. First, phase values of the SVIP on the pixels of the CCD image sensor are measured as the exact scale along the x-axis. Next, an image of the end-points of the cylinder surface is formed by extracting lights from the end-points of the cylinder. The phase of the SVIP on the end-point of the cylinder appears at a position where the amplitude of the image has maximum value along the x-axis. The x-coordinate of the end-point of the metal cylinder is calculated from the phase value of the end-point and the exact scale. The diameter is obtained from the x-coordinates of the two end-points. Metal cylinders of 9mm and 8mm-diameters are measured with an error of about ±2μm.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"ICO20: optical devices and instruments : 21-26 August 2005 : Changchun, China. : Aug 2005, Changchun, China","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.666832","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 2006 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Li, Jinhuan"}],"nameIdentifiers":[{"nameIdentifier":"169437","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169438","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"6024_60240Q.pdf","filesize":[{"value":"491.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"6024_60240Q.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31044/files/6024_60240Q.pdf"},"version_id":"2a308c05-9742-4716-9bb2-13a94af64bd2"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"diameter measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"interference pattern","subitem_subject_scheme":"Other"},{"subitem_subject":"sinusoidal phase-modulation","subitem_subject_scheme":"Other"},{"subitem_subject":"optical imaging","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern"},{"subitem_title":"Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"31044","relation_version_is_last":true,"title":["Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:59:29.262912+00:00"}