{"created":"2021-03-01T06:37:10.395557+00:00","id":31042,"links":{},"metadata":{"_buckets":{"deposit":"a09a8f11-9fa5-41dd-af39-93d4cd34d0c0"},"_deposit":{"id":"31042","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31042"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031042","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-08","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"60240F-6","bibliographicPageStart":"60240F-1","bibliographicVolumeNumber":"6024","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Interferometric displacement sensor based on a two-wavelength interferometry is proposed and demonstrated. A combination of time-shared two-wavelength laser diode and sinusoidal phase-modulating interferometry enables us to realize accurate and wide-range displacement measurement with a simple optical setup.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"ICO20: optical devices and instruments : 21-26 August 2005 : Changchun, China. : Aug 2005, Changchun, China","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.666819","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 2006 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sato, Toshihiko"}],"nameIdentifiers":[{"nameIdentifier":"169432","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169433","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"6024_60240F.pdf","filesize":[{"value":"351.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"6024_60240F.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31042/files/6024_60240F.pdf"},"version_id":"08da05e1-4dea-4b8f-bb93-c99e0b4fda6c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"displacement measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"laser diode","subitem_subject_scheme":"Other"},{"subitem_subject":"interferometry","subitem_subject_scheme":"Other"},{"subitem_subject":"sinusoidal phase-modulation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer"},{"subitem_title":"Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"31042","relation_version_is_last":true,"title":["Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:59:25.948447+00:00"}