{"created":"2021-03-01T06:37:09.995951+00:00","id":31036,"links":{},"metadata":{"_buckets":{"deposit":"726551e7-31ed-4cf8-be5f-8933fbd3dba5"},"_deposit":{"id":"31036","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31036"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031036","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-11","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"68290A-8","bibliographicPageStart":"68290A-1","bibliographicVolumeNumber":"6829","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A phase-shifting Sagnac interferometer that uses wavelength tunability of the laser diode is proposed. A Sagnac interferometer itself is robust for the mechanical disturbances because it has a common path configuration and requires no special reference. Unbalanced optical path introduced between p- and s-polarized beams enables us to implement easy phase-shift by the direct current modulation. Several experimental results indicate that the proposed system is useful for the disturbance-free precise measurement.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Advanced materials and devices for sensing and imaging 3 : 12-14 November 2007 : Beijing, China.","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.756447","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright(C)2007 Society of Photo-Optical Instrumentation Engineers"}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shirai, Masato"}],"nameIdentifiers":[{"nameIdentifier":"169409","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169410","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"6829_68290A.pdf","filesize":[{"value":"4.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"6829_68290A.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31036/files/6829_68290A.pdf"},"version_id":"42e8f45c-b334-456f-afca-0c4ecc927ff3"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"laser diode","subitem_subject_scheme":"Other"},{"subitem_subject":"Sagnac interferometer","subitem_subject_scheme":"Other"},{"subitem_subject":"phase-shift","subitem_subject_scheme":"Other"},{"subitem_subject":"surface profile measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Phase-shifting laser diode Sagnac interferometer for surface profile measurement","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Phase-shifting laser diode Sagnac interferometer for surface profile measurement"},{"subitem_title":"Phase-shifting laser diode Sagnac interferometer for surface profile measurement","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-12-18"},"publish_date":"2014-12-18","publish_status":"0","recid":"31036","relation_version_is_last":true,"title":["Phase-shifting laser diode Sagnac interferometer for surface profile measurement"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:59:30.933601+00:00"}