{"_buckets": {"deposit": "726551e7-31ed-4cf8-be5f-8933fbd3dba5"}, "_deposit": {"id": "31036", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "31036"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00031036", "sets": ["457", "1827"]}, "item_8_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2007-11", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "68290A-8", "bibliographicPageStart": "68290A-1", "bibliographicVolumeNumber": "6829", "bibliographic_titles": [{"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering"}, {"bibliographic_title": "Proceedings of SPIE - the International Society for Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_8_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A phase-shifting Sagnac interferometer that uses wavelength tunability of the laser diode is proposed. A Sagnac interferometer itself is robust for the mechanical disturbances because it has a common path configuration and requires no special reference. Unbalanced optical path introduced between p- and s-polarized beams enables us to implement easy phase-shift by the direct current modulation. Several experimental results indicate that the proposed system is useful for the disturbance-free precise measurement.", "subitem_description_type": "Abstract"}]}, "item_8_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "Advanced materials and devices for sensing and imaging 3 : 12-14 November 2007 : Beijing, China.", "subitem_description_type": "Other"}]}, "item_8_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/12.756447", "subitem_relation_type_select": "DOI"}}]}, "item_8_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright(C)2007 Society of Photo-Optical Instrumentation Engineers"}]}, "item_8_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_8_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10619755", "subitem_source_identifier_type": "NCID"}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0277786X", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Shirai, Masato"}], "nameIdentifiers": [{"nameIdentifier": "169409", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "169410", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-08-26"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "6829_68290A.pdf", "filesize": [{"value": "4.2 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 4200000.0, "url": {"label": "6829_68290A.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/31036/files/6829_68290A.pdf"}, "version_id": "42e8f45c-b334-456f-afca-0c4ecc927ff3"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "laser diode", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Sagnac interferometer", "subitem_subject_scheme": "Other"}, {"subitem_subject": "phase-shift", "subitem_subject_scheme": "Other"}, {"subitem_subject": "surface profile measurement", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Phase-shifting laser diode Sagnac interferometer for surface profile measurement", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Phase-shifting laser diode Sagnac interferometer for surface profile measurement"}, {"subitem_title": "Phase-shifting laser diode Sagnac interferometer for surface profile measurement", "subitem_title_language": "en"}]}, "item_type_id": "8", "owner": "1", "path": ["457", "1827"], "permalink_uri": "http://hdl.handle.net/10191/31155", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-12-18"}, "publish_date": "2014-12-18", "publish_status": "0", "recid": "31036", "relation": {}, "relation_version_is_last": true, "title": ["Phase-shifting laser diode Sagnac interferometer for surface profile measurement"], "weko_shared_id": null}