{"created":"2021-03-01T06:37:08.789619+00:00","id":31018,"links":{},"metadata":{"_buckets":{"deposit":"ec6d4705-1291-4713-b195-655174e2d562"},"_deposit":{"id":"31018","owners":[],"pid":{"revision_id":0,"type":"depid","value":"31018"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00031018","sets":["423:435:1827","453:457"]},"item_8_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-11","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"856302-7","bibliographicPageStart":"856302-1","bibliographicVolumeNumber":"8563","bibliographic_titles":[{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering"},{"bibliographic_title":"Proceedings of SPIE - the International Society for Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_8_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We investigated the interference amplitude and phase characteristics of a multi-frequency sweeping interferometer with sinusoidal phase modulating technique. A novel multi frequency sweeping light source that generated an interval and center frequency variable frequency comb with a bandwidth of 14 nm was demonstrated. The interference phase and amplitude distributions were investigated by observing the zeroth and first order interference signals. In addition, the zeroth and first order interference phase variations caused by center frequency sweeping were measured.","subitem_description_type":"Abstract"}]},"item_8_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Optical metrology and inspection for industrial applications 2 : 5-7 November 2012 : Beijing, China","subitem_description_type":"Other"}]},"item_8_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.999555","subitem_relation_type_select":"DOI"}}]},"item_8_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright(C)2012 Society of Photo-Optical Instrumentation Engineers"}]},"item_8_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_8_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10619755","subitem_source_identifier_type":"NCID"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0277786X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Choi, Samuel"}],"nameIdentifiers":[{"nameIdentifier":"169331","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kato, Heiichi"}],"nameIdentifiers":[{"nameIdentifier":"169332","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"169333","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-08-26"}],"displaytype":"detail","filename":"8563_856302.pdf","filesize":[{"value":"4.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"8563_856302.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/31018/files/8563_856302.pdf"},"version_id":"6dc9a737-4548-4d59-a0ee-79fd133cb451"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Interferometry","subitem_subject_scheme":"Other"},{"subitem_subject":"Multiple-frequency sweeping","subitem_subject_scheme":"Other"},{"subitem_subject":"Optical frequency comb","subitem_subject_scheme":"Other"},{"subitem_subject":"Spatial light modulation","subitem_subject_scheme":"Other"},{"subitem_subject":"Interference phase measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Multi-frequency sweeping interferometry using spatial optical frequency modulation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Multi-frequency sweeping interferometry using spatial optical frequency modulation"},{"subitem_title":"Multi-frequency sweeping interferometry using spatial optical frequency modulation","subitem_title_language":"en"}]},"item_type_id":"8","owner":"1","path":["457","1827"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-12-18"},"publish_date":"2014-12-18","publish_status":"0","recid":"31018","relation_version_is_last":true,"title":["Multi-frequency sweeping interferometry using spatial optical frequency modulation"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T04:01:34.650591+00:00"}