@article{oai:niigata-u.repo.nii.ac.jp:00002944,
 author = {新田, 勇},
 issue = {4},
 journal = {実験力学, 実験力学},
 month = {Dec},
 note = {Two different methods of measuring real contact area have been described. One was the contact microscope that was modified by elliptically polarized light and coud detect 20nm distance. The other was the thin polymer film method developed by the author. In the thin polymer method, the real contact area could be measured over the quit wide range of the nominal contact area. The effect of the surface roughness of the specimens on the thin polymer method was showed.},
 pages = {285--288},
 title = {真実接触面積の測定},
 volume = {3},
 year = {2003}
}