{"created":"2021-03-01T06:06:39.685426+00:00","id":2924,"links":{},"metadata":{"_buckets":{"deposit":"ceb5cd6a-15d7-4308-8b80-a94e2563af9e"},"_deposit":{"id":"2924","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2924"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002924"},"item_5_alternative_title_1":{"attribute_name":"\u305d\u306e\u4ed6\u306e\u30bf\u30a4\u30c8\u30eb","attribute_value_mlt":[{"subitem_alternative_title":"Evaluation of Residual Stress Distribution in Shot-Peened Steel by Synchrotron Radiation"}]},"item_5_biblio_info_6":{"attribute_name":"\u66f8\u8a8c\u60c5\u5831","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicPageEnd":"769","bibliographicPageStart":"764","bibliographicVolumeNumber":"52","bibliographic_titles":[{"bibliographic_title":"\u6750\u6599"},{"bibliographic_title":"\u6750\u6599","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"\u6284\u9332","attribute_value_mlt":[{"subitem_description":"The in-depth distribution of residual stresses in shot-peened steels was measured by using high energy X-rays from a synchrotron radiation source. The relation between the 2\u03b8 and sin^2\u03a8 was obtained with the side-inclination method (\u03a8 diffractometer). The distribution of residual stresses was first evaluated by the nonlinearity of the sin^2\u03a8 diagram by a simplex method. The estimated stress agreed with the distribution determined through the sin^2\u03a8 method by using Cr-K\u03b1 radiation combined with the conventional surface removal method. A new method was proposed to estimate the stress value of the distributed residual stress. The new method was a combination of the side-inclination method and the iso-inclination method (\u03c9 diffractometer) to maintain the penetration depth constant. The sin^2\u03a8 diagram could be approximated by the linear relationship. The evaluated stress distribution agreed well with the distribution obtained by the surface removal method.","subitem_description_type":"Abstract"}]},"item_5_full_name_3":{"attribute_name":"\u8457\u8005\u5225\u540d","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"39852","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Akiniwa, Yoshiaki"}]},{"nameIdentifiers":[{"nameIdentifier":"39853","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Tanaka, Keisuke"}]},{"nameIdentifiers":[{"nameIdentifier":"39854","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Suzuki, Kenji"}]},{"nameIdentifiers":[{"nameIdentifier":"39855","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yanase, Etuya"}]},{"nameIdentifiers":[{"nameIdentifier":"39856","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Nishio, Koji"}]},{"nameIdentifiers":[{"nameIdentifier":"39857","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kusumi, Yukihiro"}]},{"nameIdentifiers":[{"nameIdentifier":"39858","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Okado, Hideki"}]},{"nameIdentifiers":[{"nameIdentifier":"39859","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Arai, Kazuo"}]}]},"item_5_publisher_7":{"attribute_name":"\u51fa\u7248\u8005","attribute_value_mlt":[{"subitem_publisher":"\u65e5\u672c\u6750\u6599\u5b66\u4f1a"}]},"item_5_select_19":{"attribute_name":"\u8457\u8005\u7248\u30d5\u30e9\u30b0","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00096175","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05145163","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"\u8457\u8005","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"\u79cb\u5ead, \u7fa9\u660e"}],"nameIdentifiers":[{"nameIdentifier":"39844","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"\u7530\u4e2d, \u5553\u4ecb"}],"nameIdentifiers":[{"nameIdentifier":"39845","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"\u9234\u6728, \u8ce2\u6cbb"}],"nameIdentifiers":[{"nameIdentifier":"39846","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"\u67f3\u702c, \u60a6\u4e5f"}],"nameIdentifiers":[{"nameIdentifier":"39847","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"\u897f\u5c3e, \u5149\u53f8"}],"nameIdentifiers":[{"nameIdentifier":"39848","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"\u6960\u898b, \u4e4b\u535a"}],"nameIdentifiers":[{"nameIdentifier":"39849","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"\u5c3e\u89d2, \u82f1\u6bc5"}],"nameIdentifiers":[{"nameIdentifier":"39850","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"\u65b0\u4e95, \u548c\u592b"}],"nameIdentifiers":[{"nameIdentifier":"39851","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"\u30d5\u30a1\u30a4\u30eb\u60c5\u5831","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-30"}],"displaytype":"detail","filename":"ZQ_52(7)_764-769.pdf","filesize":[{"value":"729.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ZQ_52(7)_764-769.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2924/files/ZQ_52(7)_764-769.pdf"},"version_id":"998c1238-be7a-4dcf-84ee-139284f16247"}]},"item_keyword":{"attribute_name":"\u30ad\u30fc\u30ef\u30fc\u30c9","attribute_value_mlt":[{"subitem_subject":"X-ray stress measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"Synchrotron radiation","subitem_subject_scheme":"Other"},{"subitem_subject":"Shot peening","subitem_subject_scheme":"Other"},{"subitem_subject":"Residual stress","subitem_subject_scheme":"Other"},{"subitem_subject":"High energy X-rays","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"\u8a00\u8a9e","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"\u8cc7\u6e90\u30bf\u30a4\u30d7","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"\u653e\u5c04\u5149\u306b\u3088\u308b\u30b7\u30e7\u30c3\u30c8\u30d4\u30fc\u30cb\u30f3\u30b0\u6750\u306e\u6b8b\u7559\u5fdc\u529b\u5206\u5e03\u8a55\u4fa1","item_titles":{"attribute_name":"\u30bf\u30a4\u30c8\u30eb","attribute_value_mlt":[{"subitem_title":"\u653e\u5c04\u5149\u306b\u3088\u308b\u30b7\u30e7\u30c3\u30c8\u30d4\u30fc\u30cb\u30f3\u30b0\u6750\u306e\u6b8b\u7559\u5fdc\u529b\u5206\u5e03\u8a55\u4fa1"},{"subitem_title":"\u653e\u5c04\u5149\u306b\u3088\u308b\u30b7\u30e7\u30c3\u30c8\u30d4\u30fc\u30cb\u30f3\u30b0\u6750\u306e\u6b8b\u7559\u5fdc\u529b\u5206\u5e03\u8a55\u4fa1","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["453/454","154/501/502"],"pubdate":{"attribute_name":"\u516c\u958b\u65e5","attribute_value":"2012-04-05"},"publish_date":"2012-04-05","publish_status":"0","recid":"2924","relation_version_is_last":true,"title":["\u653e\u5c04\u5149\u306b\u3088\u308b\u30b7\u30e7\u30c3\u30c8\u30d4\u30fc\u30cb\u30f3\u30b0\u6750\u306e\u6b8b\u7559\u5fdc\u529b\u5206\u5e03\u8a55\u4fa1"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2021-03-01T20:21:26.448872+00:00"}