{"created":"2021-03-01T06:05:55.544867+00:00","id":2227,"links":{},"metadata":{"_buckets":{"deposit":"418604f5-4723-4e37-b045-5e49e0a050d3"},"_deposit":{"id":"2227","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2227"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002227","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"18","bibliographicPageEnd":"2685","bibliographicPageStart":"2683","bibliographicVolumeNumber":"32","bibliographic_titles":[{"bibliographic_title":"Optics Letters"},{"bibliographic_title":"Optics Letters","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Multiple-wavelength optical fields on a detecting plane of an interferometer are generated from the interference signals detected for an object surface. The generated optical fields are backpropagated along the optical axis. An optical field along the optical axis is reconstructed by summing the backpropagated fields over the multiple wavelengths. The intensity and phase distributions of the reconstructed optical field provide the position of the object surface with an accuracy of a few nanometers.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Optical Society of America"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1364/OL.32.002683","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2007 Optical Society of America"},{"subitem_rights":"This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OL.32.002683. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00764838","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"01469592","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"7546","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tai, Hisashi"}],"nameIdentifiers":[{"nameIdentifier":"7547","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"32_18_2683-2685.pdf","filesize":[{"value":"340.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"32_18_2683-2685.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2227/files/32_18_2683-2685.pdf"},"version_id":"131bbc2b-f792-49f5-ab33-677914559b12"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Step-profile measurement by backpropagation of multiple-wavelength optical fields","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Step-profile measurement by backpropagation of multiple-wavelength optical fields"},{"subitem_title":"Step-profile measurement by backpropagation of multiple-wavelength optical fields","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"2227","relation_version_is_last":true,"title":["Step-profile measurement by backpropagation of multiple-wavelength optical fields"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:35:05.596199+00:00"}