{"created":"2021-03-01T06:05:55.232408+00:00","id":2222,"links":{},"metadata":{"_buckets":{"deposit":"a57ea9e8-1ff1-48c0-82ea-0b2c70c56353"},"_deposit":{"id":"2222","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2222"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002222","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1994-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"8","bibliographicPageEnd":"2759","bibliographicPageStart":"2754","bibliographicVolumeNumber":"33","bibliographic_titles":[{"bibliographic_title":"Optical Engineering"},{"bibliographic_title":"Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A real-time 2D surface profile measurement system is described. In this system, a laser diode and a 2D charge-coupled device image sensor are used as a light source and a photodetector, respectively. The phase is detected from the sinusoidal phase-modulating interference signal using the high-speed electrical circuit. The time required for phase detection is 20 ms for 50 X 40 measuring points. Because the phases can be obtained for even and odd fields of the image sensor, the original spatial resolution of the image sensor is not reduced in this system. Repeatability of the measurements is approximately 14 nm, rms.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.173561","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1994 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00333891","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00913286","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"7529","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kaneda, Jinsaku"}],"nameIdentifiers":[{"nameIdentifier":"7530","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Maruyama, Takeo"}],"nameIdentifiers":[{"nameIdentifier":"7531","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"33_8_2754-2759.pdf","filesize":[{"value":"684.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"33_8_2754-2759.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2222/files/33_8_2754-2759.pdf"},"version_id":"e303a600-0756-457c-9d48-7655626b608a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"interferometer","subitem_subject_scheme":"Other"},{"subitem_subject":"laser diode","subitem_subject_scheme":"Other"},{"subitem_subject":"sinusoidal phase modulation","subitem_subject_scheme":"Other"},{"subitem_subject":"image sensor","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Real-time two-dimensional surface profile measurement in a sinusoidal phase-modulating laser diode interferometer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Real-time two-dimensional surface profile measurement in a sinusoidal phase-modulating laser diode interferometer"},{"subitem_title":"Real-time two-dimensional surface profile measurement in a sinusoidal phase-modulating laser diode interferometer","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"2222","relation_version_is_last":true,"title":["Real-time two-dimensional surface profile measurement in a sinusoidal phase-modulating laser diode interferometer"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:35:05.816978+00:00"}