{"created":"2021-03-01T06:05:55.170676+00:00","id":2221,"links":{},"metadata":{"_buckets":{"deposit":"3581c27e-a306-4a28-93bd-6eb73edfc7f2"},"_deposit":{"id":"2221","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2221"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002221","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1994-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"8","bibliographicPageEnd":"2674","bibliographicPageStart":"2670","bibliographicVolumeNumber":"33","bibliographic_titles":[{"bibliographic_title":"Optical Engineering"},{"bibliographic_title":"Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A sinusoidal phase-modulating Fizeau interferometer using a BaTiO3 self-pumped phase conjugator is constructed to measure surface profiles of objects with a high accuracy. An object field is formed on a surface of a glass plate where the object wave interferes with its phase conjugate wave. Because the size of the glass plate can be much smaller than that of the object, the sinusoidal phase modulation by vibrating the glass plate is easy and accurate for measurements of the surface profiles of large-diameter objects. The interferometer is self- referencing and free of the phase fluctuations of the object wave caused by spatially uniform movements of objects. The usefulness of the interferometer is made clear through the surface profile measurements of a diamond-turned aluminum disk and mirror.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.173590","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1994 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00333891","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00913286","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Wang, Xiangzhao"}],"nameIdentifiers":[{"nameIdentifier":"7523","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"7524","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takebayashi, Yuuichi"}],"nameIdentifiers":[{"nameIdentifier":"7525","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Maruyama, Takeo"}],"nameIdentifiers":[{"nameIdentifier":"7527","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"33_8_2670-2674.pdf","filesize":[{"value":"586.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"33_8_2670-2674.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2221/files/33_8_2670-2674.pdf"},"version_id":"e7255b24-8e9b-4a24-acff-9708fe7ea775"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"surface profile measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"interferometerry","subitem_subject_scheme":"Other"},{"subitem_subject":"phase conjugation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase conjugator for surface profile measurements","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase conjugator for surface profile measurements"},{"subitem_title":"Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase conjugator for surface profile measurements","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"2221","relation_version_is_last":true,"title":["Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase conjugator for surface profile measurements"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:35:05.960312+00:00"}