{"created":"2021-03-01T06:05:55.106868+00:00","id":2220,"links":{},"metadata":{"_buckets":{"deposit":"8451073e-71b8-43b9-89b0-c4ec25511334"},"_deposit":{"id":"2220","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2220"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002220","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageEnd":"2963","bibliographicPageStart":"2957","bibliographicVolumeNumber":"34","bibliographic_titles":[{"bibliographic_title":"Optical Engineering"},{"bibliographic_title":"Optical Engineering","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We propose a method of exact measurement of flat surface profiles in a phase-conjugate Fizeau interferometer. Aberration of lenses causes an undesirable phase distribution in the interference signal of the phase-conjugate Fizeau interferometer. To eliminate this phase distribution, we shift the object in two directions orthogonal to each other and displacements of the object surface involved in the shifts lead to some small errors in the difference values. We estimate an exact surface profile by solving the difference equations. Characteristics of the method are made clear through computer simulations and measurments of a 40-mm-diameter flat mirror.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"International Society for Optical Engineering, SPIE"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1117/12.210750","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1995 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00333891","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00913286","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"7519","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takebayashi, Yuuichi"}],"nameIdentifiers":[{"nameIdentifier":"7520","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Wang, Xiangzhao"}],"nameIdentifiers":[{"nameIdentifier":"7521","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"34_10_2957-2963.pdf","filesize":[{"value":"781.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"34_10_2957-2963.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2220/files/34_10_2957-2963.pdf"},"version_id":"f9eb22ef-c14c-4f0f-932e-45e703498d3a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"flatness testing","subitem_subject_scheme":"Other"},{"subitem_subject":"interferometers","subitem_subject_scheme":"Other"},{"subitem_subject":"phase conjugation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer"},{"subitem_title":"Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"2220","relation_version_is_last":true,"title":["Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:35:06.182738+00:00"}