@article{oai:niigata-u.repo.nii.ac.jp:00002220,
 author = {Sasaki, Osami and Takebayashi, Yuuichi and Wang, Xiangzhao and Suzuki, Takamasa},
 issue = {10},
 journal = {Optical Engineering, Optical Engineering},
 month = {Oct},
 note = {We propose a method of exact measurement of flat surface profiles in a phase-conjugate Fizeau interferometer. Aberration of lenses causes an undesirable phase distribution in the interference signal of the phase-conjugate Fizeau interferometer. To eliminate this phase distribution, we shift the object in two directions orthogonal to each other and displacements of the object surface involved in the shifts lead to some small errors in the difference values. We estimate an exact surface profile by solving the difference equations. Characteristics of the method are made clear through computer simulations and measurments of a 40-mm-diameter flat mirror.},
 pages = {2957--2963},
 title = {Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer},
 volume = {34},
 year = {1995}
}