{"_buckets": {"deposit": "c03a1df7-b1df-41cb-88f9-c0512525b51d"}, "_deposit": {"id": "2218", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "2218"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00002218"}, "item_5_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1996-02", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicPageEnd": "497", "bibliographicPageStart": "492", "bibliographicVolumeNumber": "35", "bibliographic_titles": [{"bibliographic_title": "Optical Engineering"}, {"bibliographic_title": "Optical Engineering", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "A new type of two-wavelength interferometer which applies a phase-lock technique is described. The wavelength tenability of a laser diode (LD) is used for phase modulation and phase control in this interferometer. Since the two wavelengths are derived from a single LD in our system, the optical system is simple and there is no need to consider the fluctuation of relative wavelength between the two LD\u0027s in the conventional two-wavelength interferometers. The equivalent wavelength \u039b is 15 mm and the measurement accuracy reaches-\u039b/400. The error sources in the system and the error analysis are also described.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_7": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "International Society for Optical Engineering, SPIE"}]}, "item_5_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1117/1.600921", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_15": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright 1996 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited."}]}, "item_5_select_19": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00333891", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00913286", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "7513", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Maruyama, Takeo"}], "nameIdentifiers": [{"nameIdentifier": "7514", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-29"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "35_2_492-497.pdf", "filesize": [{"value": "620.0 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 620000.0, "url": {"label": "35_2_492-497.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/2218/files/35_2_492-497.pdf"}, "version_id": "db3686e1-c566-489a-b29f-c028eea1840c"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "two-wavelength interferometers", "subitem_subject_scheme": "Other"}, {"subitem_subject": "laser diodes", "subitem_subject_scheme": "Other"}, {"subitem_subject": "phase lock", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry"}, {"subitem_title": "Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["453/454", "423/424/425"], "permalink_uri": "http://hdl.handle.net/10191/27607", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "2218", "relation": {}, "relation_version_is_last": true, "title": ["Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry"], "weko_shared_id": null}