{"created":"2021-03-01T06:05:50.132386+00:00","id":2141,"links":{},"metadata":{"_buckets":{"deposit":"dfb66bd7-ec15-44a7-97de-87df266cf51c"},"_deposit":{"id":"2141","owners":[],"pid":{"revision_id":0,"type":"depid","value":"2141"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00002141","sets":["154:501:502","453:454"]},"author_link":["7176","7177","7178","7179","7180"],"control_number":"2141","item_1627363077551":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"381","bibliographicPageStart":"376","bibliographicVolumeNumber":"49","bibliographic_titles":[{"bibliographic_title":"JSME International Journal. Series A, Solid mechanics and material engineering.","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The surface aberration effect in the strain scanning method with a Ge analyzer was examined　using high-energy X-rays from the undulator synchrotron source. The synchrotron X-rays from the undulator source had an enough intensity for the strain scanning method using a goniometer with the analyzer. The use of a Ge (111) analyzer showed remarkable reduction of the surface aberration effect. However, there still existed the surface aberration for the very-near surface region from the surface to the depth of 50μm. A correction method was proposed by taking into account of the effects of the divergence of the Ge analyzer, the mis-setting of the analyzer and the X-ray attenuation. The proposed correction method was very useful for eliminating the surface aberration effect. The correction method enables a high space-resolutive evaluation of the subsurface stress distribution. The method was successfully applied to the determination of the residual stress distribution of the shot-peened steel. A precise do value of the strain-free lattice spacing necessary was determined from the surface stress measured by the conventional sin^2Ψ method using Cr-Kα radiation.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Japan Society of Mechanical Engineers","subitem_publisher_language":"en"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://doi.org/10.1299/jsmea.49.376","subitem_relation_type_select":"DOI"}}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11179396","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1344-7912","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shobu, Takahisa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7176","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mizuki, Jun'ichiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7177","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Kenji","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7178","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Akiniwa, Yoshiaki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7179","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tanaka, Keisuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7180","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"49-3_376.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"49-3_376.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/2141/files/49-3_376.pdf"},"version_id":"909b79c2-5546-4ae3-a12d-8745da41d3b7"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Residual Stress","subitem_subject_scheme":"Other"},{"subitem_subject":"Experimental Stress Analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"Nondestructive Inspection","subitem_subject_scheme":"Other"},{"subitem_subject":"X-Ray Stress Measurement","subitem_subject_scheme":"Other"},{"subitem_subject":"Synchrotron Radiation","subitem_subject_scheme":"Other"},{"subitem_subject":"Strain Scanning Method","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"High Space-Resolutive Evaluation of Subsurface Stress Distribution by Strain Scanning Method with Analyzer Using High-Energy Synchrotron X-Rays","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"High Space-Resolutive Evaluation of Subsurface Stress Distribution by Strain Scanning Method with Analyzer Using High-Energy Synchrotron X-Rays","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","502"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2012-06-04"},"publish_date":"2012-06-04","publish_status":"0","recid":"2141","relation_version_is_last":true,"title":["High Space-Resolutive Evaluation of Subsurface Stress Distribution by Strain Scanning Method with Analyzer Using High-Energy Synchrotron X-Rays"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2022-12-15T03:35:02.031620+00:00"}