@article{oai:niigata-u.repo.nii.ac.jp:00002141,
 author = {Shobu, Takahisa and Mizuki, Jun'ichiro and Suzuki, Kenji and Akiniwa, Yoshiaki and Tanaka, Keisuke},
 issue = {3},
 journal = {JSME International Journal. Series A, Solid mechanics and material engineering.},
 month = {},
 note = {The surface aberration effect in the strain scanning method with a Ge analyzer was examined　using high-energy X-rays from the undulator synchrotron source. The synchrotron X-rays from the undulator source had an enough intensity for the strain scanning method using a goniometer with the analyzer. The use of a Ge (111) analyzer showed remarkable reduction of the surface aberration effect. However, there still existed the surface aberration for the very-near surface region from the surface to the depth of 50μm. A correction method was proposed by taking into account of the effects of the divergence of the Ge analyzer, the mis-setting of the analyzer and the X-ray attenuation. The proposed correction method was very useful for eliminating the surface aberration effect. The correction method enables a high space-resolutive evaluation of the subsurface stress distribution. The method was successfully applied to the determination of the residual stress distribution of the shot-peened steel. A precise do value of the strain-free lattice spacing necessary was determined from the surface stress measured by the conventional sin^2Ψ method using Cr-Kα radiation.},
 pages = {376--381},
 title = {High Space-Resolutive Evaluation of Subsurface Stress Distribution by Strain Scanning Method with Analyzer Using High-Energy Synchrotron X-Rays},
 volume = {49},
 year = {2006}
}