{"created":"2021-03-01T06:05:22.628316+00:00","id":1702,"links":{},"metadata":{"_buckets":{"deposit":"79104010-d2d8-4377-93a8-93cf19629c41"},"_deposit":{"id":"1702","owners":[],"pid":{"revision_id":0,"type":"depid","value":"1702"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00001702","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"297","bibliographicPageStart":"295","bibliographicVolumeNumber":"11","bibliographic_titles":[{"bibliographic_title":"IEEE Communications Letters"},{"bibliographic_title":"IEEE Communications Letters","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Based on the characteristic function method, an exact error analysis is presented for low-duty pulsed direct sequence code division multiple access (DS-CDMA) systems in flat Nakagami fading channel. The presented method is simple and good for any arbitrary pulse shape. The computational involvement of the method is simpler than the method based on improved Gaussian approximation (IGA), which is the only reliable method currently available for calculating error probabilities of such systems","subitem_description_type":"Abstract"}]},"item_5_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"5103","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Sasaki, Shigenobu"}]},{"nameIdentifiers":[{"nameIdentifier":"5104","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kikuchi, Hisakazu"}]},{"nameIdentifiers":[{"nameIdentifier":"5105","nameIdentifierScheme":"WEKO"}],"names":[{"name":"佐々木, 重信"}]},{"nameIdentifiers":[{"nameIdentifier":"5106","nameIdentifierScheme":"WEKO"}],"names":[{"name":"菊池, 久和"}]}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/LCOM.2007.348279","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"©(2007) IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained the IEEE."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11114040","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10897798","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Rahman, M. A."}],"nameIdentifiers":[{"nameIdentifier":"5100","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, S."}],"nameIdentifiers":[{"nameIdentifier":"5101","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kikuchi, H."}],"nameIdentifiers":[{"nameIdentifier":"5102","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"rahman-coml-2007-04.pdf","filesize":[{"value":"174.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"rahman-coml-2007-04.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/1702/files/rahman-coml-2007-04.pdf"},"version_id":"3be92583-c7c7-40bf-949f-4f79e2329d23"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Multiaccess communication","subitem_subject_scheme":"Other"},{"subitem_subject":"ultra-wideband","subitem_subject_scheme":"Other"},{"subitem_subject":"Nakagami fading","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"An Exact Error Analysis for Low-Duty Pulsed DS-CDMA Systems in Flat Nakagami Fading","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"An Exact Error Analysis for Low-Duty Pulsed DS-CDMA Systems in Flat Nakagami Fading"},{"subitem_title":"An Exact Error Analysis for Low-Duty Pulsed DS-CDMA Systems in Flat Nakagami Fading","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2007-09-07"},"publish_date":"2007-09-07","publish_status":"0","recid":"1702","relation_version_is_last":true,"title":["An Exact Error Analysis for Low-Duty Pulsed DS-CDMA Systems in Flat Nakagami Fading"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:34:27.810015+00:00"}