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  1. 060 工学部
  2. 10 学術雑誌論文
  3. 10 査読済論文
  1. 0 資料タイプ別
  2. 01 学術雑誌論文

Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns

http://hdl.handle.net/10191/27502
http://hdl.handle.net/10191/27502
8d7d4c8e-5c3b-49b1-8627-aec3c7e7e889
名前 / ファイル ライセンス アクション
35_28_5657-5666.pdf 35_28_5657-5666.pdf (977.1 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2014-06-20
タイトル
タイトル Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns
タイトル
言語 en
タイトル Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns
言語
言語 eng
キーワード
主題Scheme Other
主題 Two-dimensional small rotation angles
キーワード
主題Scheme Other
主題 orthogonal parallel interference patterns
キーワード
主題Scheme Other
主題 interferometry
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ journal article
著者 Dai, Xiaoli

× Dai, Xiaoli

WEKO 4195

Dai, Xiaoli

Search repository
Sasaki, Osami

× Sasaki, Osami

WEKO 4196

Sasaki, Osami

Search repository
Greivenkamp, John E.

× Greivenkamp, John E.

WEKO 4197

Greivenkamp, John E.

Search repository
Suzuki, Takamasa

× Suzuki, Takamasa

WEKO 39

Suzuki, Takamasa

Search repository
抄録
内容記述タイプ Abstract
内容記述 Based on measuring one-dimensional small rotation angles by using a parallel interference pattern (PIP), a method lor measuring two-dimensional (2D) small rotation angles by using two different PIP's that are orthogonal to each other is proposed. We simultaneously measure the 2D small rotation angles Δθ and ΔΦ by detecting the phases of the orthogonal PIP's reflected by an object at two detection points. A sensitivity of4.9 mrad/arcsec and a spatial resolution of 1.5 × 1.5 mm^2 are achieved in the measurement. Theoretical analysis and experimental results show that errorε1 in the measurement of ΔΦ is almost equal to -0.01Δθ and errore ε2 in the measuremcnt of Δθis almost equal to -0.01A ΔΦ. For small rotation angles of less than a few tens of arcseconds, the random errors whose standard deviations are 0.6 arcsec are dominant.
書誌情報 Applied Optics
en : Applied Optics

巻 35, 号 28, p. 5657-5666, 発行日 1996-10
出版者
出版者 Optical Society of America
ISSN
収録物識別子タイプ ISSN
収録物識別子 00036935
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA00543409
DOI
識別子タイプ DOI
関連識別子 info:doi/10.1364/AO.35.005657
権利
権利情報 © 1996 Optical Society of America
権利
権利情報 This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.35.005657. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
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