{"_buckets": {"deposit": "5a4e8829-0afa-4cb8-be8c-3bae93d57ab2"}, "_deposit": {"id": "1537", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "1537"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00001537"}, "item_5_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1996-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "28", "bibliographicPageEnd": "5666", "bibliographicPageStart": "5657", "bibliographicVolumeNumber": "35", "bibliographic_titles": [{"bibliographic_title": "Applied Optics"}, {"bibliographic_title": "Applied Optics", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "Based on measuring one-dimensional small rotation angles by using a parallel interference pattern (PIP), a method lor measuring two-dimensional (2D) small rotation angles by using two different PIP\u0027s that are orthogonal to each other is proposed. We simultaneously measure the 2D small rotation angles \u0394\u03b8 and \u0394\u03a6 by detecting the phases of the orthogonal PIP\u0027s reflected by an object at two detection points. A sensitivity of4.9 mrad/arcsec and a spatial resolution of 1.5 \u00d7 1.5 mm^2 are achieved in the measurement. Theoretical analysis and experimental results show that error\u03b51 in the measurement of \u0394\u03a6 is almost equal to -0.01\u0394\u03b8 and errore \u03b52 in the measuremcnt of \u0394\u03b8is almost equal to -0.01A \u0394\u03a6. For small rotation angles of less than a few tens of arcseconds, the random errors whose standard deviations are 0.6 arcsec are dominant.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_7": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "Optical Society of America"}]}, "item_5_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1364/AO.35.005657", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_15": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "\u00a9 1996 Optical Society of America"}, {"subitem_rights": "This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.35.005657. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]}, "item_5_select_19": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00543409", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00036935", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Dai, Xiaoli"}], "nameIdentifiers": [{"nameIdentifier": "4195", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "4196", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Greivenkamp, John E."}], "nameIdentifiers": [{"nameIdentifier": "4197", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-29"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "35_28_5657-5666.pdf", "filesize": [{"value": "977.1 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 977100.0, "url": {"label": "35_28_5657-5666.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/1537/files/35_28_5657-5666.pdf"}, "version_id": "66e764b3-0324-4a8d-b51a-db872a5ad707"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Two-dimensional small rotation angles", "subitem_subject_scheme": "Other"}, {"subitem_subject": "orthogonal parallel interference patterns", "subitem_subject_scheme": "Other"}, {"subitem_subject": "interferometry", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns"}, {"subitem_title": "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["453/454", "423/424/425"], "permalink_uri": "http://hdl.handle.net/10191/27502", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "1537", "relation": {}, "relation_version_is_last": true, "title": ["Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns"], "weko_shared_id": null}