{"_buckets": {"deposit": "5a4e8829-0afa-4cb8-be8c-3bae93d57ab2"}, "_deposit": {"id": "1537", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "1537"}, "status": "published"}, "_oai": {"id": "oai:niigata-u.repo.nii.ac.jp:00001537", "sets": ["454", "425"]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1996-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "28", "bibliographicPageEnd": "5666", "bibliographicPageStart": "5657", "bibliographicVolumeNumber": "35", "bibliographic_titles": [{"bibliographic_title": "Applied Optics"}, {"bibliographic_title": "Applied Optics", "bibliographic_titleLang": "en"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Based on measuring one-dimensional small rotation angles by using a parallel interference pattern (PIP), a method lor measuring two-dimensional (2D) small rotation angles by using two different PIP\u0027s that are orthogonal to each other is proposed. We simultaneously measure the 2D small rotation angles Δθ and ΔΦ by detecting the phases of the orthogonal PIP\u0027s reflected by an object at two detection points. A sensitivity of4.9 mrad/arcsec and a spatial resolution of 1.5 × 1.5 mm^2 are achieved in the measurement. Theoretical analysis and experimental results show that errorε1 in the measurement of ΔΦ is almost equal to -0.01Δθ and errore ε2 in the measuremcnt of Δθis almost equal to -0.01A ΔΦ. For small rotation angles of less than a few tens of arcseconds, the random errors whose standard deviations are 0.6 arcsec are dominant.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_7": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Optical Society of America"}]}, "item_5_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "info:doi/10.1364/AO.35.005657", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© 1996 Optical Society of America"}, {"subitem_rights": "This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.35.005657. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]}, "item_5_select_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_5_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00543409", "subitem_source_identifier_type": "NCID"}]}, "item_5_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00036935", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Dai, Xiaoli"}], "nameIdentifiers": [{"nameIdentifier": "4195", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Osami"}], "nameIdentifiers": [{"nameIdentifier": "4196", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Greivenkamp, John E."}], "nameIdentifiers": [{"nameIdentifier": "4197", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Suzuki, Takamasa"}], "nameIdentifiers": [{"nameIdentifier": "39", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-07-29"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "35_28_5657-5666.pdf", "filesize": [{"value": "977.1 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 977100.0, "url": {"label": "35_28_5657-5666.pdf", "url": "https://niigata-u.repo.nii.ac.jp/record/1537/files/35_28_5657-5666.pdf"}, "version_id": "66e764b3-0324-4a8d-b51a-db872a5ad707"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Two-dimensional small rotation angles", "subitem_subject_scheme": "Other"}, {"subitem_subject": "orthogonal parallel interference patterns", "subitem_subject_scheme": "Other"}, {"subitem_subject": "interferometry", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns"}, {"subitem_title": "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["454", "425"], "permalink_uri": "http://hdl.handle.net/10191/27502", "pubdate": {"attribute_name": "公開日", "attribute_value": "2014-06-20"}, "publish_date": "2014-06-20", "publish_status": "0", "recid": "1537", "relation": {}, "relation_version_is_last": true, "title": ["Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns"], "weko_shared_id": null}