{"created":"2021-03-01T06:05:12.287229+00:00","id":1534,"links":{},"metadata":{"_buckets":{"deposit":"e992cb27-0c37-48d7-a074-3dbcc789443d"},"_deposit":{"id":"1534","owners":[],"pid":{"revision_id":0,"type":"depid","value":"1534"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00001534","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"22","bibliographicPageEnd":"5131","bibliographicPageStart":"5126","bibliographicVolumeNumber":"37","bibliographic_titles":[{"bibliographic_title":"Applied Optics"},{"bibliographic_title":"Applied Optics","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We propose an interferometer in which the relationship between the degree of coherence (DCH) and the optical path difference (OPD) is utilized for determining an OPD longer than a wavelength. A superluminescent diode is employed as the source of the interferometer, and sinusoidal phase-modulating interferometry is used to detect the DCH and the phase of the interference signal. The combination of the OPD determined from the DCH and the phase of an interference signal enables us to measure an OPD longer than a wavelength with a high accuracy of a few nanometers. Experimental results show clearly the usefulness of the interferometer for a step-profile measurement.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Optical Society of America"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1364/AO.37.005126","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 1998 Optical Society of America"},{"subitem_rights":"This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.37.005126. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00543409","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00036935","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"4184","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ikeada, Yoshihiro"}],"nameIdentifiers":[{"nameIdentifier":"4185","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"37_22_5126-5131.pdf","filesize":[{"value":"552.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"37_22_5126-5131.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/1534/files/37_22_5126-5131.pdf"},"version_id":"563d47ed-3a8f-4505-be47-4de2f00a51c3"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Superluminescent diode interferometer using sinusoidal phase modulation for step profile measurement","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Superluminescent diode interferometer using sinusoidal phase modulation for step profile measurement"},{"subitem_title":"Superluminescent diode interferometer using sinusoidal phase modulation for step profile measurement","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"1534","relation_version_is_last":true,"title":["Superluminescent diode interferometer using sinusoidal phase modulation for step profile measurement"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:34:07.563330+00:00"}