{"created":"2021-03-01T06:05:12.105037+00:00","id":1531,"links":{},"metadata":{"_buckets":{"deposit":"f0d67388-c71d-4ba7-a011-de67c78af6f4"},"_deposit":{"id":"1531","owners":[],"pid":{"revision_id":0,"type":"depid","value":"1531"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00001531","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"22","bibliographicPageEnd":"3853","bibliographicPageStart":"3847","bibliographicVolumeNumber":"39","bibliographic_titles":[{"bibliographic_title":"Applied Optics"},{"bibliographic_title":"Applied Optics","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We propose interferometric reflectometry in which a sinusoidal wavelength-scanning tunable laser diode is used to detect positions and profiles of multiple reflecting surfaces. An objective signal extracted from an interference signal contains modulation amplitude Z and phase alpha, which are related to the positions and profiles, respectively, of multiple reflecting surfaces. By using values of the objective signal at special times, we can produce an image intensity that shows where the reflecting surfaces exist. To obtain exact values of Z or values of alpha, we estimated the objective signal by using a conjugate gradient method. Experimental results show that a resolution of two-optical-path difference (OPD) in the image intensity is approximately 60 microm, and the final OPD precisions are 2 and 8 microm for two and three reflecting surfaces, respectively, for a wavelength-scanning width of 7 nm. Profiles of the front and rear surfaces of a silica glass plate with a thickness of 20 microm have been measured with a precision of approximately 10 nm.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Optical Society of America"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1364/AO.39.003847","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2000 Optical Society of America"},{"subitem_rights":"This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.39.003847. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00543409","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00036935","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"4173","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kuwahara, Tomokazu"}],"nameIdentifiers":[{"nameIdentifier":"4174","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hara, Ryohta"}],"nameIdentifiers":[{"nameIdentifier":"4175","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"39_22_3847-3853.pdf","filesize":[{"value":"697.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"39_22_3847-3853.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/1531/files/39_22_3847-3853.pdf"},"version_id":"9952b300-0bb9-435c-80b5-0a7a6e3ffed2"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Sinusoidal wavelength-scanning interferometric reflectometry","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Sinusoidal wavelength-scanning interferometric reflectometry"},{"subitem_title":"Sinusoidal wavelength-scanning interferometric reflectometry","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"1531","relation_version_is_last":true,"title":["Sinusoidal wavelength-scanning interferometric reflectometry"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:34:08.027433+00:00"}