{"created":"2021-03-01T06:05:11.801317+00:00","id":1526,"links":{},"metadata":{"_buckets":{"deposit":"a92f2126-29ea-4660-b5b9-233bb068dabb"},"_deposit":{"id":"1526","owners":[],"pid":{"revision_id":0,"type":"depid","value":"1526"},"status":"published"},"_oai":{"id":"oai:niigata-u.repo.nii.ac.jp:00001526","sets":["423:424:425","453:454"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"19","bibliographicPageEnd":"3910","bibliographicPageStart":"3906","bibliographicVolumeNumber":"41","bibliographic_titles":[{"bibliographic_title":"Applied Optics"},{"bibliographic_title":"Applied Optics","bibliographic_titleLang":"en"}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In addition to a conventional phase a the interference signal of a sinusoidal-wavelength-scanning interferometer has a phase-modulation amplitude Zb that is proportional to the optical path difference L and amplitude b of the wavelength scan. L and b are controlled by a double feedback system so that the phase alpha and the amplitude Zb are kept at 3pi/2 and pi, respectively. The voltage applied to a device that displaces a reference mirror to change the optical path difference becomes a ruler with scales smaller than a wavelength. Voltage applied to a device that determines the amplitude of the wavelength scan becomes a ruler marking every wavelength. These two rulers enable one to measure an absolute distance longer than a wavelength in real time.","subitem_description_type":"Abstract"}]},"item_5_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Optical Society of America"}]},"item_5_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1364/AO.41.003906","subitem_relation_type_select":"DOI"}}]},"item_5_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2002 Optical Society of America"},{"subitem_rights":"This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.41.003906. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law."}]},"item_5_select_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_5_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00543409","subitem_source_identifier_type":"NCID"}]},"item_5_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00036935","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sasaki, Osami"}],"nameIdentifiers":[{"nameIdentifier":"4157","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Akiyama, Kazuhiro"}],"nameIdentifiers":[{"nameIdentifier":"4158","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Takamasa"}],"nameIdentifiers":[{"nameIdentifier":"39","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-07-29"}],"displaytype":"detail","filename":"41_19_3906-3910.pdf","filesize":[{"value":"555.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"41_19_3906-3910.pdf","url":"https://niigata-u.repo.nii.ac.jp/record/1526/files/41_19_3906-3910.pdf"},"version_id":"55ae7120-9d16-4345-bacd-e236e0a8676d"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement"},{"subitem_title":"Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["454","425"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-06-20"},"publish_date":"2014-06-20","publish_status":"0","recid":"1526","relation_version_is_last":true,"title":["Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-15T03:34:08.143447+00:00"}