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  1. 060 工学部
  2. 10 学術雑誌論文
  3. 10 査読済論文
  1. 0 資料タイプ別
  2. 01 学術雑誌論文

Extension of distance measurement range in a sinusoidal wavelength-scanning interferometer using a liquid-crystal wavelength filter with double feedback control

http://hdl.handle.net/10191/27522
030498f4-1468-44f3-90e7-888db68c8eac
名前 / ファイル ライセンス アクション
46_23_5800-5804.pdf 46_23_5800-5804.pdf (614.3 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2014-06-20
タイトル
タイトル Extension of distance measurement range in a sinusoidal wavelength-scanning interferometer using a liquid-crystal wavelength filter with double feedback control
タイトル
言語 en
タイトル Extension of distance measurement range in a sinusoidal wavelength-scanning interferometer using a liquid-crystal wavelength filter with double feedback control
言語
言語 eng
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ journal article
著者 Sasaki, Osami

× Sasaki, Osami

WEKO 4134

Sasaki, Osami

Search repository
Saito, Akihiro

× Saito, Akihiro

WEKO 4135

Saito, Akihiro

Search repository
Suzuki, Takamasa

× Suzuki, Takamasa

WEKO 39

Suzuki, Takamasa

Search repository
Takeda, Mitsuo

× Takeda, Mitsuo

WEKO 4137

Takeda, Mitsuo

Search repository
Kurokawa, Takashi

× Kurokawa, Takashi

WEKO 4138

Kurokawa, Takashi

Search repository
抄録
内容記述タイプ Abstract
内容記述 The optical path difference (OPD) and amplitude of a sinusoidal wavelength scanning (SWS) are controlled with a double feedback control system in an interferometer, so that a ruler marking every wavelength and a ruler with scales smaller than a wavelength are generated. These two rulers enable us to measure an OPD longer than a wavelength. A liquid-crystal Fabry-Perot interferometer (LC-FPI) is adopted as a wavelength-scanning device, and double sinusoidal phase modulation is incorporated in the SWS interferometer. Because of a high resolution of the LC-FPI, the upper limit of the measurement range can be extended to 280 μm by the use of the phase lock where the amplitude of the SWS is doubled in the feedback control. The ruler marking every wavelength is generated between 80 μm and 280 μm, and distances are measured with a high accuracy of the order of a nanometer in real time.
書誌情報 Applied Optics
en : Applied Optics

巻 46, 号 23, p. 5800-5804, 発行日 2007-09
出版者
出版者 Optical Society of America
ISSN
収録物識別子タイプ ISSN
収録物識別子 00036935
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA00543409
DOI
関連識別子
識別子タイプ DOI
関連識別子 info:doi/10.1364/AO.46.005800
権利
権利情報 © 2007 Optical Society of America
権利
権利情報 This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.46.005800. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
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